AFCI arcing data generation and acquisition control method and system based on impedance network

The invention relates to the technical field of arcing data processing, and discloses an AFCI arcing data generation and acquisition control method and system based on an impedance network, and the method comprises the steps: S1, starting self-inspection by a device, reading a large-scale scene conf...

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Hauptverfasser: YIN ZHENGPING, SUN JINZHOU, ZHANG TAO, ZHANG HAIQIANG, WANG SHUO
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creator YIN ZHENGPING
SUN JINZHOU
ZHANG TAO
ZHANG HAIQIANG
WANG SHUO
description The invention relates to the technical field of arcing data processing, and discloses an AFCI arcing data generation and acquisition control method and system based on an impedance network, and the method comprises the steps: S1, starting self-inspection by a device, reading a large-scale scene configuration file, configuring the working mode of the device according to a needed test scene, reading an impedance network scene configuration file, and carrying out the self-inspection; initializing an initial state and global configuration of each device; s2, setting an impedance network state, carrying out arcing data acquisition, labeling and processing until small scenes configured by all impedance networks in the current large scene are executed, and recovering all equipment states; and S3, testing all currently specified large scenes. Data are collected through a relatively complete simulation environment, a control system needs to cope with switching of complex scenes, changes of a hardware environment are r
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN118672641A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN118672641A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN118672641A3</originalsourceid><addsrcrecordid>eNqNjUEKwjAQRbtxIeodxgO4iEp1W4JFN67c1zGZ1mAzicmIeHtL8QCuPo_34E-La1XrE2AyjjuwKAgdMSUUFxiQLaB5vlx2I5vAkkIPnuQe7KjzJwt5uGEmC0PifCSLbAiY5B3SY15MWuwzLX47K5b14aKPK4qhoRzRDH_S6LNS-3K3Lreq2vzTfAF05zz-</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>AFCI arcing data generation and acquisition control method and system based on impedance network</title><source>esp@cenet</source><creator>YIN ZHENGPING ; SUN JINZHOU ; ZHANG TAO ; ZHANG HAIQIANG ; WANG SHUO</creator><creatorcontrib>YIN ZHENGPING ; SUN JINZHOU ; ZHANG TAO ; ZHANG HAIQIANG ; WANG SHUO</creatorcontrib><description>The invention relates to the technical field of arcing data processing, and discloses an AFCI arcing data generation and acquisition control method and system based on an impedance network, and the method comprises the steps: S1, starting self-inspection by a device, reading a large-scale scene configuration file, configuring the working mode of the device according to a needed test scene, reading an impedance network scene configuration file, and carrying out the self-inspection; initializing an initial state and global configuration of each device; s2, setting an impedance network state, carrying out arcing data acquisition, labeling and processing until small scenes configured by all impedance networks in the current large scene are executed, and recovering all equipment states; and S3, testing all currently specified large scenes. Data are collected through a relatively complete simulation environment, a control system needs to cope with switching of complex scenes, changes of a hardware environment are r</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240920&amp;DB=EPODOC&amp;CC=CN&amp;NR=118672641A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240920&amp;DB=EPODOC&amp;CC=CN&amp;NR=118672641A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YIN ZHENGPING</creatorcontrib><creatorcontrib>SUN JINZHOU</creatorcontrib><creatorcontrib>ZHANG TAO</creatorcontrib><creatorcontrib>ZHANG HAIQIANG</creatorcontrib><creatorcontrib>WANG SHUO</creatorcontrib><title>AFCI arcing data generation and acquisition control method and system based on impedance network</title><description>The invention relates to the technical field of arcing data processing, and discloses an AFCI arcing data generation and acquisition control method and system based on an impedance network, and the method comprises the steps: S1, starting self-inspection by a device, reading a large-scale scene configuration file, configuring the working mode of the device according to a needed test scene, reading an impedance network scene configuration file, and carrying out the self-inspection; initializing an initial state and global configuration of each device; s2, setting an impedance network state, carrying out arcing data acquisition, labeling and processing until small scenes configured by all impedance networks in the current large scene are executed, and recovering all equipment states; and S3, testing all currently specified large scenes. Data are collected through a relatively complete simulation environment, a control system needs to cope with switching of complex scenes, changes of a hardware environment are r</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjUEKwjAQRbtxIeodxgO4iEp1W4JFN67c1zGZ1mAzicmIeHtL8QCuPo_34E-La1XrE2AyjjuwKAgdMSUUFxiQLaB5vlx2I5vAkkIPnuQe7KjzJwt5uGEmC0PifCSLbAiY5B3SY15MWuwzLX47K5b14aKPK4qhoRzRDH_S6LNS-3K3Lreq2vzTfAF05zz-</recordid><startdate>20240920</startdate><enddate>20240920</enddate><creator>YIN ZHENGPING</creator><creator>SUN JINZHOU</creator><creator>ZHANG TAO</creator><creator>ZHANG HAIQIANG</creator><creator>WANG SHUO</creator><scope>EVB</scope></search><sort><creationdate>20240920</creationdate><title>AFCI arcing data generation and acquisition control method and system based on impedance network</title><author>YIN ZHENGPING ; SUN JINZHOU ; ZHANG TAO ; ZHANG HAIQIANG ; WANG SHUO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN118672641A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>YIN ZHENGPING</creatorcontrib><creatorcontrib>SUN JINZHOU</creatorcontrib><creatorcontrib>ZHANG TAO</creatorcontrib><creatorcontrib>ZHANG HAIQIANG</creatorcontrib><creatorcontrib>WANG SHUO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YIN ZHENGPING</au><au>SUN JINZHOU</au><au>ZHANG TAO</au><au>ZHANG HAIQIANG</au><au>WANG SHUO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>AFCI arcing data generation and acquisition control method and system based on impedance network</title><date>2024-09-20</date><risdate>2024</risdate><abstract>The invention relates to the technical field of arcing data processing, and discloses an AFCI arcing data generation and acquisition control method and system based on an impedance network, and the method comprises the steps: S1, starting self-inspection by a device, reading a large-scale scene configuration file, configuring the working mode of the device according to a needed test scene, reading an impedance network scene configuration file, and carrying out the self-inspection; initializing an initial state and global configuration of each device; s2, setting an impedance network state, carrying out arcing data acquisition, labeling and processing until small scenes configured by all impedance networks in the current large scene are executed, and recovering all equipment states; and S3, testing all currently specified large scenes. Data are collected through a relatively complete simulation environment, a control system needs to cope with switching of complex scenes, changes of a hardware environment are r</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title AFCI arcing data generation and acquisition control method and system based on impedance network
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T08%3A58%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YIN%20ZHENGPING&rft.date=2024-09-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN118672641A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true