Response bandwidth measuring device and method of capacitance type tip clearance measuring system based on variable capacitance diode

The invention discloses a response bandwidth measuring device and method of a capacitance type blade tip gap measuring system based on a variable capacitance diode, the capacitance type blade tip gap measuring system is composed of a capacitance sensor, a measuring system host and an upper computer...

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Hauptverfasser:	NIU GUANGYUE, LI FAFU, ZHOU QI, LI FANGYI, JIANG JIAJIA, DUAN FAJIE, LIU HAO, FU XIAO
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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creator	NIU GUANGYUE LI FAFU ZHOU QI LI FANGYI JIANG JIAJIA DUAN FAJIE LIU HAO FU XIAO
description	The invention discloses a response bandwidth measuring device and method of a capacitance type blade tip gap measuring system based on a variable capacitance diode, the capacitance type blade tip gap measuring system is composed of a capacitance sensor, a measuring system host and an upper computer which are connected in sequence, and the measuring system host comprises a signal demodulation module and an acquisition module. The capacitance sensor is composed of a sensor probe and a tri-coaxial cable which are connected with each other, the response bandwidth measuring device is connected with the tri-coaxial cable through an SMA connector after replacing the sensor probe, and a variable capacitance diode is adopted to simulate capacitance change caused by the fact that a blade tip of a rotating blade sweeps the capacitance sensor probe; the response bandwidth measuring device is composed of a variable capacitance diode D, a resistor R1, a capacitor C1 and a capacitor C2. Two ends of the capacitor C2 connecte
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subjects	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
title	Response bandwidth measuring device and method of capacitance type tip clearance measuring system based on variable capacitance diode
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