Industrial key quality index prediction method based on long-term and short-term dependence of time sequence

The embodiment of the invention provides an industrial key quality index prediction method based on time sequence long and short term dependence, and belongs to the technical field of data processing, and the method specifically comprises the steps: determining a key quality index, and screening out...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HE XINFANG, YIN ZIZE, HUANG LEXUE, HUANG XIAOLONG, YU LIUFA, LIU HONGRUI, LIU DIJU, LIU CHENLIANG, WANG YALIN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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