Metal plate defect three-dimensional feature inversion method and system

The invention relates to a metal plate defect three-dimensional feature inversion method, and the method comprises the steps: obtaining a defect detection signal of a to-be-detected metal plate, and determining the defect position of the to-be-detected metal plate through the defect detection signal...

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Bibliographische Detailangaben
Hauptverfasser: HU YUCHUN, ZHOU LIN, MENG XU, LIU DACHEN, JIA JINGKUN, LI GUANGZHEN, WANG YIMENG, WANG HONGWEI, ZHAO HONGWEI, LI JIANHUA, YAN JUNJIE
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention relates to a metal plate defect three-dimensional feature inversion method, and the method comprises the steps: obtaining a defect detection signal of a to-be-detected metal plate, and determining the defect position of the to-be-detected metal plate through the defect detection signal; collecting receiving signals of the defect position at different angles; establishing a defect model of the to-be-detected metal plate, performing sampling processing to obtain defect parameters, and obtaining simulation signals corresponding to the defect parameters; respectively extracting instantaneous phase and wave envelope information of the two signals, and performing fitting processing by using the instantaneous phase and wave envelope information to construct an inversion target function for inversion processing to obtain defect size information of the metal plate to be detected; and performing three-dimensional feature reconstruction on the defect position by using the size information. According to the