LED chip defect detection method and system based on artificial intelligence

The invention relates to the technical field of chip detection, and provides an LED chip defect detection method and system based on artificial intelligence. The method comprises the following steps: aiming at each LED chip detection position on a detection substrate, controlling a temperature adjus...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	GU LEYE
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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