LED chip defect detection method and system based on artificial intelligence

LED chip defect detection method and system based on artificial intelligence

The invention relates to the technical field of chip detection, and provides an LED chip defect detection method and system based on artificial intelligence. The method comprises the following steps: aiming at each LED chip detection position on a detection substrate, controlling a temperature adjus...

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1. Verfasser: GU LEYE
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Sprache:chi ; eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator GU LEYE
description The invention relates to the technical field of chip detection, and provides an LED chip defect detection method and system based on artificial intelligence. The method comprises the following steps: aiming at each LED chip detection position on a detection substrate, controlling a temperature adjusting device corresponding to the LED chip detection position to adjust the temperature of a detected LED chip on the LED chip detection position based on a preset temperature control curve, and adjusting the temperature of the detected LED chip on the LED chip detection position in the process of adjusting the temperature of the detected LED chip by the temperature adjusting device, shooting the detected LED chip through a camera device corresponding to the LED chip detection position to obtain a target video of the detected LED chip in the heating process; and for each detected LED chip on the detection substrate, inputting the target video corresponding to the detected LED chip into a preset stability coefficient
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title LED chip defect detection method and system based on artificial intelligence
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