Grain grain falling track image acquisition test device
The invention relates to a grain grain falling track image acquisition test device which comprises a device support and a rotating support, a grain falling pipe is arranged on the rotating support, a grain loading hole is formed in the side wall of the grain falling pipe, and a left grain support an...
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| creator | LIU SHIMIN ZHAO CHAO ZHANG HAOBO ZHANG ZHONGYUAN MA HONGLIN LIU JIAQI LUO TAOYING BAI CHUNQI YAN LEI HOU XIAOLONG XU JIWEN |
| description | The invention relates to a grain grain falling track image acquisition test device which comprises a device support and a rotating support, a grain falling pipe is arranged on the rotating support, a grain loading hole is formed in the side wall of the grain falling pipe, and a left grain support and a right grain support are hinged to the positions, on the lower side of the grain loading hole, of the grain falling pipe. The adjacent ends of the left grain support and the right grain support are supporting ends, the opposite ends of the left grain support and the right grain support are control ends, the left grain support and the right grain support are provided with a bearing station and a grain falling station in the rotating process, and a high-speed camera used for shooting the free falling process of the grains is arranged beside the device support. The invention provides the grain falling track testing device for the grain grains, which is used for observing the movement track and posture change of the |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN118501146A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN118501146A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN118501146A3</originalsourceid><addsrcrecordid>eNrjZDB3L0rMzFNIB5NpiTk5mXnpCiVFicnZCpm5iempConJhaWZxZklmfl5CiWpxSUKKallmcmpPAysQNXFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSTe2c_Q0MLUwNDQxMzRmBg1AL89LcQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Grain grain falling track image acquisition test device</title><source>esp@cenet</source><creator>LIU SHIMIN ; ZHAO CHAO ; ZHANG HAOBO ; ZHANG ZHONGYUAN ; MA HONGLIN ; LIU JIAQI ; LUO TAOYING ; BAI CHUNQI ; YAN LEI ; HOU XIAOLONG ; XU JIWEN</creator><creatorcontrib>LIU SHIMIN ; ZHAO CHAO ; ZHANG HAOBO ; ZHANG ZHONGYUAN ; MA HONGLIN ; LIU JIAQI ; LUO TAOYING ; BAI CHUNQI ; YAN LEI ; HOU XIAOLONG ; XU JIWEN</creatorcontrib><description>The invention relates to a grain grain falling track image acquisition test device which comprises a device support and a rotating support, a grain falling pipe is arranged on the rotating support, a grain loading hole is formed in the side wall of the grain falling pipe, and a left grain support and a right grain support are hinged to the positions, on the lower side of the grain loading hole, of the grain falling pipe. The adjacent ends of the left grain support and the right grain support are supporting ends, the opposite ends of the left grain support and the right grain support are control ends, the left grain support and the right grain support are provided with a bearing station and a grain falling station in the rotating process, and a high-speed camera used for shooting the free falling process of the grains is arranged beside the device support. The invention provides the grain falling track testing device for the grain grains, which is used for observing the movement track and posture change of the</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240816&DB=EPODOC&CC=CN&NR=118501146A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240816&DB=EPODOC&CC=CN&NR=118501146A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LIU SHIMIN</creatorcontrib><creatorcontrib>ZHAO CHAO</creatorcontrib><creatorcontrib>ZHANG HAOBO</creatorcontrib><creatorcontrib>ZHANG ZHONGYUAN</creatorcontrib><creatorcontrib>MA HONGLIN</creatorcontrib><creatorcontrib>LIU JIAQI</creatorcontrib><creatorcontrib>LUO TAOYING</creatorcontrib><creatorcontrib>BAI CHUNQI</creatorcontrib><creatorcontrib>YAN LEI</creatorcontrib><creatorcontrib>HOU XIAOLONG</creatorcontrib><creatorcontrib>XU JIWEN</creatorcontrib><title>Grain grain falling track image acquisition test device</title><description>The invention relates to a grain grain falling track image acquisition test device which comprises a device support and a rotating support, a grain falling pipe is arranged on the rotating support, a grain loading hole is formed in the side wall of the grain falling pipe, and a left grain support and a right grain support are hinged to the positions, on the lower side of the grain loading hole, of the grain falling pipe. The adjacent ends of the left grain support and the right grain support are supporting ends, the opposite ends of the left grain support and the right grain support are control ends, the left grain support and the right grain support are provided with a bearing station and a grain falling station in the rotating process, and a high-speed camera used for shooting the free falling process of the grains is arranged beside the device support. The invention provides the grain falling track testing device for the grain grains, which is used for observing the movement track and posture change of the</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB3L0rMzFNIB5NpiTk5mXnpCiVFicnZCpm5iempConJhaWZxZklmfl5CiWpxSUKKallmcmpPAysQNXFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSTe2c_Q0MLUwNDQxMzRmBg1AL89LcQ</recordid><startdate>20240816</startdate><enddate>20240816</enddate><creator>LIU SHIMIN</creator><creator>ZHAO CHAO</creator><creator>ZHANG HAOBO</creator><creator>ZHANG ZHONGYUAN</creator><creator>MA HONGLIN</creator><creator>LIU JIAQI</creator><creator>LUO TAOYING</creator><creator>BAI CHUNQI</creator><creator>YAN LEI</creator><creator>HOU XIAOLONG</creator><creator>XU JIWEN</creator><scope>EVB</scope></search><sort><creationdate>20240816</creationdate><title>Grain grain falling track image acquisition test device</title><author>LIU SHIMIN ; ZHAO CHAO ; ZHANG HAOBO ; ZHANG ZHONGYUAN ; MA HONGLIN ; LIU JIAQI ; LUO TAOYING ; BAI CHUNQI ; YAN LEI ; HOU XIAOLONG ; XU JIWEN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN118501146A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LIU SHIMIN</creatorcontrib><creatorcontrib>ZHAO CHAO</creatorcontrib><creatorcontrib>ZHANG HAOBO</creatorcontrib><creatorcontrib>ZHANG ZHONGYUAN</creatorcontrib><creatorcontrib>MA HONGLIN</creatorcontrib><creatorcontrib>LIU JIAQI</creatorcontrib><creatorcontrib>LUO TAOYING</creatorcontrib><creatorcontrib>BAI CHUNQI</creatorcontrib><creatorcontrib>YAN LEI</creatorcontrib><creatorcontrib>HOU XIAOLONG</creatorcontrib><creatorcontrib>XU JIWEN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LIU SHIMIN</au><au>ZHAO CHAO</au><au>ZHANG HAOBO</au><au>ZHANG ZHONGYUAN</au><au>MA HONGLIN</au><au>LIU JIAQI</au><au>LUO TAOYING</au><au>BAI CHUNQI</au><au>YAN LEI</au><au>HOU XIAOLONG</au><au>XU JIWEN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Grain grain falling track image acquisition test device</title><date>2024-08-16</date><risdate>2024</risdate><abstract>The invention relates to a grain grain falling track image acquisition test device which comprises a device support and a rotating support, a grain falling pipe is arranged on the rotating support, a grain loading hole is formed in the side wall of the grain falling pipe, and a left grain support and a right grain support are hinged to the positions, on the lower side of the grain loading hole, of the grain falling pipe. The adjacent ends of the left grain support and the right grain support are supporting ends, the opposite ends of the left grain support and the right grain support are control ends, the left grain support and the right grain support are provided with a bearing station and a grain falling station in the rotating process, and a high-speed camera used for shooting the free falling process of the grains is arranged beside the device support. The invention provides the grain falling track testing device for the grain grains, which is used for observing the movement track and posture change of the</abstract><oa>free_for_read</oa></addata></record> |
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| title | Grain grain falling track image acquisition test device |
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