Clock tester calibration method, device and system
The invention relates to a clock tester calibration method, device and system, and relates to the technical field of instrument calibration, and the method comprises the steps: obtaining a first image of a to-be-detected clock tester and a second image of a reference clock; converting clock tester t...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a clock tester calibration method, device and system, and relates to the technical field of instrument calibration, and the method comprises the steps: obtaining a first image of a to-be-detected clock tester and a second image of a reference clock; converting clock tester time information in the first image into clock tester time data, and converting reference time information in the second image into reference time data; and determining a clock moment error value according to the clock tester time data and the reference time data, and calibrating the clock tester according to the clock moment error value. According to the embodiment of the invention, the metering calibration efficiency of the clock tester can be greatly improved, and the accuracy of the obtained clock moment error value is improved.
本申请涉及一种时钟测试仪校准方法、装置及系统,涉及仪器校准技术领域,该方法包括:获取待检时钟测试仪的第一图像以及参考时钟的第二图像;将所述第一图像中的时钟测试仪时间信息转换为时钟测试仪时间数据,以及将所述第二图像中的参考时间信息转换为参考时间数据;根据所述时钟测试仪时间数据和所述参考时间数据确定时钟时刻误差值,根据所述时钟时刻误差值校准所述时钟测试仪。本发明实施例可以大 |
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