Voltage transformer fault diagnosis method, device, equipment and medium
The invention belongs to the technical field of equipment fault diagnosis, and particularly discloses a voltage transformer fault diagnosis method and device, equipment and a medium. Comprising the following steps: acquiring time sequence voltage data of a secondary side of a voltage transformer, an...
Gespeichert in:
Hauptverfasser: | , , , , , , , , , , , , , , , , , , , , , , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | LIU YUEXIAO DING NING YANG GUANGHUA YI XIN BU ZHIWEN LI RUI FENG GUOZHENG ZHANG BORU ZHU JINSHAN ZENG WEIHE LI QIAN LI XIUFANG DONG YU JIANG JUN LI XIN LI NA LU XIANGYU YUAN MINGMIN SHI PENGBO ZHANG YING WEI CHUANKAI JIA JIA WANG ZICHENG LI MINGKAI ZHANG YUAN LIU HENG YAO PENG |
description | The invention belongs to the technical field of equipment fault diagnosis, and particularly discloses a voltage transformer fault diagnosis method and device, equipment and a medium. Comprising the following steps: acquiring time sequence voltage data of a secondary side of a voltage transformer, and converting the time sequence voltage data into two-dimensional image data; the time sequence voltage data and the two-dimensional image data are segmented respectively, and image features and time sequence features are calculated according to the segmented time sequence voltage data and the segmented two-dimensional image data; performing feature enhancement on the image features and the time sequence features, and performing multi-granularity contrast learning according to the enhanced image features and time sequence features to obtain enhanced image features and enhanced time sequence features; and fusing the enhanced image features and the enhanced time sequence features to obtain fusion features, and inputti |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN118393419A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN118393419A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN118393419A3</originalsourceid><addsrcrecordid>eNqNyisOAjEURuEaBAH2cPGDaIpgJJlARqEIdnIz_Ts06Ys-WD8IFoA64jtrMT6iq7yAauZQTMwemQw3V0lbXkIstpBHfUbdkcbbzugIr2aTR6jEQX9V2-a3YmXYFex-3Yj99XIfxgNSnFASzwio03CT8qR6dZT9Wf3zfAC_yzR0</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Voltage transformer fault diagnosis method, device, equipment and medium</title><source>esp@cenet</source><creator>LIU YUEXIAO ; DING NING ; YANG GUANGHUA ; YI XIN ; BU ZHIWEN ; LI RUI ; FENG GUOZHENG ; ZHANG BORU ; ZHU JINSHAN ; ZENG WEIHE ; LI QIAN ; LI XIUFANG ; DONG YU ; JIANG JUN ; LI XIN ; LI NA ; LU XIANGYU ; YUAN MINGMIN ; SHI PENGBO ; ZHANG YING ; WEI CHUANKAI ; JIA JIA ; WANG ZICHENG ; LI MINGKAI ; ZHANG YUAN ; LIU HENG ; YAO PENG</creator><creatorcontrib>LIU YUEXIAO ; DING NING ; YANG GUANGHUA ; YI XIN ; BU ZHIWEN ; LI RUI ; FENG GUOZHENG ; ZHANG BORU ; ZHU JINSHAN ; ZENG WEIHE ; LI QIAN ; LI XIUFANG ; DONG YU ; JIANG JUN ; LI XIN ; LI NA ; LU XIANGYU ; YUAN MINGMIN ; SHI PENGBO ; ZHANG YING ; WEI CHUANKAI ; JIA JIA ; WANG ZICHENG ; LI MINGKAI ; ZHANG YUAN ; LIU HENG ; YAO PENG</creatorcontrib><description>The invention belongs to the technical field of equipment fault diagnosis, and particularly discloses a voltage transformer fault diagnosis method and device, equipment and a medium. Comprising the following steps: acquiring time sequence voltage data of a secondary side of a voltage transformer, and converting the time sequence voltage data into two-dimensional image data; the time sequence voltage data and the two-dimensional image data are segmented respectively, and image features and time sequence features are calculated according to the segmented time sequence voltage data and the segmented two-dimensional image data; performing feature enhancement on the image features and the time sequence features, and performing multi-granularity contrast learning according to the enhanced image features and time sequence features to obtain enhanced image features and enhanced time sequence features; and fusing the enhanced image features and the enhanced time sequence features to obtain fusion features, and inputti</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240726&DB=EPODOC&CC=CN&NR=118393419A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240726&DB=EPODOC&CC=CN&NR=118393419A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LIU YUEXIAO</creatorcontrib><creatorcontrib>DING NING</creatorcontrib><creatorcontrib>YANG GUANGHUA</creatorcontrib><creatorcontrib>YI XIN</creatorcontrib><creatorcontrib>BU ZHIWEN</creatorcontrib><creatorcontrib>LI RUI</creatorcontrib><creatorcontrib>FENG GUOZHENG</creatorcontrib><creatorcontrib>ZHANG BORU</creatorcontrib><creatorcontrib>ZHU JINSHAN</creatorcontrib><creatorcontrib>ZENG WEIHE</creatorcontrib><creatorcontrib>LI QIAN</creatorcontrib><creatorcontrib>LI XIUFANG</creatorcontrib><creatorcontrib>DONG YU</creatorcontrib><creatorcontrib>JIANG JUN</creatorcontrib><creatorcontrib>LI XIN</creatorcontrib><creatorcontrib>LI NA</creatorcontrib><creatorcontrib>LU XIANGYU</creatorcontrib><creatorcontrib>YUAN MINGMIN</creatorcontrib><creatorcontrib>SHI PENGBO</creatorcontrib><creatorcontrib>ZHANG YING</creatorcontrib><creatorcontrib>WEI CHUANKAI</creatorcontrib><creatorcontrib>JIA JIA</creatorcontrib><creatorcontrib>WANG ZICHENG</creatorcontrib><creatorcontrib>LI MINGKAI</creatorcontrib><creatorcontrib>ZHANG YUAN</creatorcontrib><creatorcontrib>LIU HENG</creatorcontrib><creatorcontrib>YAO PENG</creatorcontrib><title>Voltage transformer fault diagnosis method, device, equipment and medium</title><description>The invention belongs to the technical field of equipment fault diagnosis, and particularly discloses a voltage transformer fault diagnosis method and device, equipment and a medium. Comprising the following steps: acquiring time sequence voltage data of a secondary side of a voltage transformer, and converting the time sequence voltage data into two-dimensional image data; the time sequence voltage data and the two-dimensional image data are segmented respectively, and image features and time sequence features are calculated according to the segmented time sequence voltage data and the segmented two-dimensional image data; performing feature enhancement on the image features and the time sequence features, and performing multi-granularity contrast learning according to the enhanced image features and time sequence features to obtain enhanced image features and enhanced time sequence features; and fusing the enhanced image features and the enhanced time sequence features to obtain fusion features, and inputti</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyisOAjEURuEaBAH2cPGDaIpgJJlARqEIdnIz_Ts06Ys-WD8IFoA64jtrMT6iq7yAauZQTMwemQw3V0lbXkIstpBHfUbdkcbbzugIr2aTR6jEQX9V2-a3YmXYFex-3Yj99XIfxgNSnFASzwio03CT8qR6dZT9Wf3zfAC_yzR0</recordid><startdate>20240726</startdate><enddate>20240726</enddate><creator>LIU YUEXIAO</creator><creator>DING NING</creator><creator>YANG GUANGHUA</creator><creator>YI XIN</creator><creator>BU ZHIWEN</creator><creator>LI RUI</creator><creator>FENG GUOZHENG</creator><creator>ZHANG BORU</creator><creator>ZHU JINSHAN</creator><creator>ZENG WEIHE</creator><creator>LI QIAN</creator><creator>LI XIUFANG</creator><creator>DONG YU</creator><creator>JIANG JUN</creator><creator>LI XIN</creator><creator>LI NA</creator><creator>LU XIANGYU</creator><creator>YUAN MINGMIN</creator><creator>SHI PENGBO</creator><creator>ZHANG YING</creator><creator>WEI CHUANKAI</creator><creator>JIA JIA</creator><creator>WANG ZICHENG</creator><creator>LI MINGKAI</creator><creator>ZHANG YUAN</creator><creator>LIU HENG</creator><creator>YAO PENG</creator><scope>EVB</scope></search><sort><creationdate>20240726</creationdate><title>Voltage transformer fault diagnosis method, device, equipment and medium</title><author>LIU YUEXIAO ; DING NING ; YANG GUANGHUA ; YI XIN ; BU ZHIWEN ; LI RUI ; FENG GUOZHENG ; ZHANG BORU ; ZHU JINSHAN ; ZENG WEIHE ; LI QIAN ; LI XIUFANG ; DONG YU ; JIANG JUN ; LI XIN ; LI NA ; LU XIANGYU ; YUAN MINGMIN ; SHI PENGBO ; ZHANG YING ; WEI CHUANKAI ; JIA JIA ; WANG ZICHENG ; LI MINGKAI ; ZHANG YUAN ; LIU HENG ; YAO PENG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN118393419A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LIU YUEXIAO</creatorcontrib><creatorcontrib>DING NING</creatorcontrib><creatorcontrib>YANG GUANGHUA</creatorcontrib><creatorcontrib>YI XIN</creatorcontrib><creatorcontrib>BU ZHIWEN</creatorcontrib><creatorcontrib>LI RUI</creatorcontrib><creatorcontrib>FENG GUOZHENG</creatorcontrib><creatorcontrib>ZHANG BORU</creatorcontrib><creatorcontrib>ZHU JINSHAN</creatorcontrib><creatorcontrib>ZENG WEIHE</creatorcontrib><creatorcontrib>LI QIAN</creatorcontrib><creatorcontrib>LI XIUFANG</creatorcontrib><creatorcontrib>DONG YU</creatorcontrib><creatorcontrib>JIANG JUN</creatorcontrib><creatorcontrib>LI XIN</creatorcontrib><creatorcontrib>LI NA</creatorcontrib><creatorcontrib>LU XIANGYU</creatorcontrib><creatorcontrib>YUAN MINGMIN</creatorcontrib><creatorcontrib>SHI PENGBO</creatorcontrib><creatorcontrib>ZHANG YING</creatorcontrib><creatorcontrib>WEI CHUANKAI</creatorcontrib><creatorcontrib>JIA JIA</creatorcontrib><creatorcontrib>WANG ZICHENG</creatorcontrib><creatorcontrib>LI MINGKAI</creatorcontrib><creatorcontrib>ZHANG YUAN</creatorcontrib><creatorcontrib>LIU HENG</creatorcontrib><creatorcontrib>YAO PENG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LIU YUEXIAO</au><au>DING NING</au><au>YANG GUANGHUA</au><au>YI XIN</au><au>BU ZHIWEN</au><au>LI RUI</au><au>FENG GUOZHENG</au><au>ZHANG BORU</au><au>ZHU JINSHAN</au><au>ZENG WEIHE</au><au>LI QIAN</au><au>LI XIUFANG</au><au>DONG YU</au><au>JIANG JUN</au><au>LI XIN</au><au>LI NA</au><au>LU XIANGYU</au><au>YUAN MINGMIN</au><au>SHI PENGBO</au><au>ZHANG YING</au><au>WEI CHUANKAI</au><au>JIA JIA</au><au>WANG ZICHENG</au><au>LI MINGKAI</au><au>ZHANG YUAN</au><au>LIU HENG</au><au>YAO PENG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Voltage transformer fault diagnosis method, device, equipment and medium</title><date>2024-07-26</date><risdate>2024</risdate><abstract>The invention belongs to the technical field of equipment fault diagnosis, and particularly discloses a voltage transformer fault diagnosis method and device, equipment and a medium. Comprising the following steps: acquiring time sequence voltage data of a secondary side of a voltage transformer, and converting the time sequence voltage data into two-dimensional image data; the time sequence voltage data and the two-dimensional image data are segmented respectively, and image features and time sequence features are calculated according to the segmented time sequence voltage data and the segmented two-dimensional image data; performing feature enhancement on the image features and the time sequence features, and performing multi-granularity contrast learning according to the enhanced image features and time sequence features to obtain enhanced image features and enhanced time sequence features; and fusing the enhanced image features and the enhanced time sequence features to obtain fusion features, and inputti</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN118393419A |
source | esp@cenet |
subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | Voltage transformer fault diagnosis method, device, equipment and medium |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T16%3A01%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LIU%20YUEXIAO&rft.date=2024-07-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN118393419A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |