Thermoelectric test auxiliary equipment based on integrated chip
The invention discloses thermoelectric test auxiliary equipment based on an integrated chip, and relates to the technical field of thermoelectric performance detection, the thermoelectric test auxiliary equipment comprises a supporting structure, the supporting structure comprises a chip main body,...
Gespeichert in:
| Hauptverfasser: | , , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | ZHU JINHUI WU HAORU WANG YUJING AI YULIN LU YINPENG |
| description | The invention discloses thermoelectric test auxiliary equipment based on an integrated chip, and relates to the technical field of thermoelectric performance detection, the thermoelectric test auxiliary equipment comprises a supporting structure, the supporting structure comprises a chip main body, the right side of the chip main body is provided with a detection mechanism, the left side of the chip main body is provided with a dust removal mechanism, and the front end of the chip main body is provided with a conveying mechanism; the detection mechanism comprises electrical detectors for observing and recording multiple detection data, the electrical detectors are located on the front side and the rear side of the chip body, and the detection mechanism is used for conducting surface heating and thermoelectric performance detection operation on the chip body. Compared with the prior art, an operator can know the performance of the chip at a high temperature more easily, the use process is smoother, potential p |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN118393320A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN118393320A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN118393320A3</originalsourceid><addsrcrecordid>eNrjZHAIyUgtys1PzUlNLinKTFYoSS0uUUgsrcjMyUwsqlRILSzNLMhNzStRSEosTk1RyM9TyMwrSU0vSiwB8pIzMgt4GFjTEnOKU3mhNDeDoptriLOHbmpBfnxqcUFicmpeakm8s5-hoYWxpbGxkYGjMTFqABieMdQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Thermoelectric test auxiliary equipment based on integrated chip</title><source>esp@cenet</source><creator>ZHU JINHUI ; WU HAORU ; WANG YUJING ; AI YULIN ; LU YINPENG</creator><creatorcontrib>ZHU JINHUI ; WU HAORU ; WANG YUJING ; AI YULIN ; LU YINPENG</creatorcontrib><description>The invention discloses thermoelectric test auxiliary equipment based on an integrated chip, and relates to the technical field of thermoelectric performance detection, the thermoelectric test auxiliary equipment comprises a supporting structure, the supporting structure comprises a chip main body, the right side of the chip main body is provided with a detection mechanism, the left side of the chip main body is provided with a dust removal mechanism, and the front end of the chip main body is provided with a conveying mechanism; the detection mechanism comprises electrical detectors for observing and recording multiple detection data, the electrical detectors are located on the front side and the rear side of the chip body, and the detection mechanism is used for conducting surface heating and thermoelectric performance detection operation on the chip body. Compared with the prior art, an operator can know the performance of the chip at a high temperature more easily, the use process is smoother, potential p</description><language>chi ; eng</language><subject>CLEANING ; CLEANING IN GENERAL ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PERFORMING OPERATIONS ; PHYSICS ; PREVENTION OF FOULING IN GENERAL ; TESTING ; TRANSPORTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240726&DB=EPODOC&CC=CN&NR=118393320A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240726&DB=EPODOC&CC=CN&NR=118393320A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHU JINHUI</creatorcontrib><creatorcontrib>WU HAORU</creatorcontrib><creatorcontrib>WANG YUJING</creatorcontrib><creatorcontrib>AI YULIN</creatorcontrib><creatorcontrib>LU YINPENG</creatorcontrib><title>Thermoelectric test auxiliary equipment based on integrated chip</title><description>The invention discloses thermoelectric test auxiliary equipment based on an integrated chip, and relates to the technical field of thermoelectric performance detection, the thermoelectric test auxiliary equipment comprises a supporting structure, the supporting structure comprises a chip main body, the right side of the chip main body is provided with a detection mechanism, the left side of the chip main body is provided with a dust removal mechanism, and the front end of the chip main body is provided with a conveying mechanism; the detection mechanism comprises electrical detectors for observing and recording multiple detection data, the electrical detectors are located on the front side and the rear side of the chip body, and the detection mechanism is used for conducting surface heating and thermoelectric performance detection operation on the chip body. Compared with the prior art, an operator can know the performance of the chip at a high temperature more easily, the use process is smoother, potential p</description><subject>CLEANING</subject><subject>CLEANING IN GENERAL</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>PREVENTION OF FOULING IN GENERAL</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHAIyUgtys1PzUlNLinKTFYoSS0uUUgsrcjMyUwsqlRILSzNLMhNzStRSEosTk1RyM9TyMwrSU0vSiwB8pIzMgt4GFjTEnOKU3mhNDeDoptriLOHbmpBfnxqcUFicmpeakm8s5-hoYWxpbGxkYGjMTFqABieMdQ</recordid><startdate>20240726</startdate><enddate>20240726</enddate><creator>ZHU JINHUI</creator><creator>WU HAORU</creator><creator>WANG YUJING</creator><creator>AI YULIN</creator><creator>LU YINPENG</creator><scope>EVB</scope></search><sort><creationdate>20240726</creationdate><title>Thermoelectric test auxiliary equipment based on integrated chip</title><author>ZHU JINHUI ; WU HAORU ; WANG YUJING ; AI YULIN ; LU YINPENG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN118393320A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>CLEANING</topic><topic>CLEANING IN GENERAL</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>PREVENTION OF FOULING IN GENERAL</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHU JINHUI</creatorcontrib><creatorcontrib>WU HAORU</creatorcontrib><creatorcontrib>WANG YUJING</creatorcontrib><creatorcontrib>AI YULIN</creatorcontrib><creatorcontrib>LU YINPENG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHU JINHUI</au><au>WU HAORU</au><au>WANG YUJING</au><au>AI YULIN</au><au>LU YINPENG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Thermoelectric test auxiliary equipment based on integrated chip</title><date>2024-07-26</date><risdate>2024</risdate><abstract>The invention discloses thermoelectric test auxiliary equipment based on an integrated chip, and relates to the technical field of thermoelectric performance detection, the thermoelectric test auxiliary equipment comprises a supporting structure, the supporting structure comprises a chip main body, the right side of the chip main body is provided with a detection mechanism, the left side of the chip main body is provided with a dust removal mechanism, and the front end of the chip main body is provided with a conveying mechanism; the detection mechanism comprises electrical detectors for observing and recording multiple detection data, the electrical detectors are located on the front side and the rear side of the chip body, and the detection mechanism is used for conducting surface heating and thermoelectric performance detection operation on the chip body. Compared with the prior art, an operator can know the performance of the chip at a high temperature more easily, the use process is smoother, potential p</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN118393320A |
| source | esp@cenet |
| subjects | CLEANING CLEANING IN GENERAL MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PERFORMING OPERATIONS PHYSICS PREVENTION OF FOULING IN GENERAL TESTING TRANSPORTING |
| title | Thermoelectric test auxiliary equipment based on integrated chip |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T15%3A24%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ZHU%20JINHUI&rft.date=2024-07-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN118393320A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |