Element detection method based on LIBS technology
The invention provides an element detection method based on an LIBS (laser-induced breakdown spectroscopy) technology, which comprises the following steps: (A1) segmenting a sample scanning track to enable each segment to be linear; (A2) corresponding to each segment Li, the distance hi between the...
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| creator | LUO ZHENGSHENG ZHU MING XU JUHONG XU DAWEI ZHU PENGCHENG ZHOU YIQUN SHEN SONGSONG WANG QINGXIANG YU ZHENGNING FANG CHENG HE JUNXING |
| description | The invention provides an element detection method based on an LIBS (laser-induced breakdown spectroscopy) technology, which comprises the following steps: (A1) segmenting a sample scanning track to enable each segment to be linear; (A2) corresponding to each segment Li, the distance hi between the light emitting unit and the sample is adjusted according to the step length, a data set (Iij, hij) corresponding to each excitation point in the segment is obtained, Iij is a spectral signal obtained at the excitation point, hij is the distance between the light emitting unit and the sample at the excitation point, i = 1, 2... M, j = 1, 2... N, and M and N are integers greater than 2; according to the M data sets (Iij, hij), the optimal distance hi0 corresponding to the segment Li is obtained; (A3) adjusting the distance between the light emitting unit and the sample to hi0, and scanning to obtain a spectral signal Ii corresponding to the segment Li; (A4) obtaining the optimal light intensity I according to the spe |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN118392846A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN118392846A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN118392846A3</originalsourceid><addsrcrecordid>eNrjZDB0zUnNTc0rUUhJLUlNLsnMz1PITS3JyE9RSEosTk1RAPJ9PJ2CFYCSGXn5OfnplTwMrGmJOcWpvFCam0HRzTXE2UM3tSA_PrW4IDE5NS-1JN7Zz9DQwtjSyMLEzNGYGDUAXr8rOA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Element detection method based on LIBS technology</title><source>esp@cenet</source><creator>LUO ZHENGSHENG ; ZHU MING ; XU JUHONG ; XU DAWEI ; ZHU PENGCHENG ; ZHOU YIQUN ; SHEN SONGSONG ; WANG QINGXIANG ; YU ZHENGNING ; FANG CHENG ; HE JUNXING</creator><creatorcontrib>LUO ZHENGSHENG ; ZHU MING ; XU JUHONG ; XU DAWEI ; ZHU PENGCHENG ; ZHOU YIQUN ; SHEN SONGSONG ; WANG QINGXIANG ; YU ZHENGNING ; FANG CHENG ; HE JUNXING</creatorcontrib><description>The invention provides an element detection method based on an LIBS (laser-induced breakdown spectroscopy) technology, which comprises the following steps: (A1) segmenting a sample scanning track to enable each segment to be linear; (A2) corresponding to each segment Li, the distance hi between the light emitting unit and the sample is adjusted according to the step length, a data set (Iij, hij) corresponding to each excitation point in the segment is obtained, Iij is a spectral signal obtained at the excitation point, hij is the distance between the light emitting unit and the sample at the excitation point, i = 1, 2... M, j = 1, 2... N, and M and N are integers greater than 2; according to the M data sets (Iij, hij), the optimal distance hi0 corresponding to the segment Li is obtained; (A3) adjusting the distance between the light emitting unit and the sample to hi0, and scanning to obtain a spectral signal Ii corresponding to the segment Li; (A4) obtaining the optimal light intensity I according to the spe</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240726&DB=EPODOC&CC=CN&NR=118392846A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240726&DB=EPODOC&CC=CN&NR=118392846A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LUO ZHENGSHENG</creatorcontrib><creatorcontrib>ZHU MING</creatorcontrib><creatorcontrib>XU JUHONG</creatorcontrib><creatorcontrib>XU DAWEI</creatorcontrib><creatorcontrib>ZHU PENGCHENG</creatorcontrib><creatorcontrib>ZHOU YIQUN</creatorcontrib><creatorcontrib>SHEN SONGSONG</creatorcontrib><creatorcontrib>WANG QINGXIANG</creatorcontrib><creatorcontrib>YU ZHENGNING</creatorcontrib><creatorcontrib>FANG CHENG</creatorcontrib><creatorcontrib>HE JUNXING</creatorcontrib><title>Element detection method based on LIBS technology</title><description>The invention provides an element detection method based on an LIBS (laser-induced breakdown spectroscopy) technology, which comprises the following steps: (A1) segmenting a sample scanning track to enable each segment to be linear; (A2) corresponding to each segment Li, the distance hi between the light emitting unit and the sample is adjusted according to the step length, a data set (Iij, hij) corresponding to each excitation point in the segment is obtained, Iij is a spectral signal obtained at the excitation point, hij is the distance between the light emitting unit and the sample at the excitation point, i = 1, 2... M, j = 1, 2... N, and M and N are integers greater than 2; according to the M data sets (Iij, hij), the optimal distance hi0 corresponding to the segment Li is obtained; (A3) adjusting the distance between the light emitting unit and the sample to hi0, and scanning to obtain a spectral signal Ii corresponding to the segment Li; (A4) obtaining the optimal light intensity I according to the spe</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB0zUnNTc0rUUhJLUlNLsnMz1PITS3JyE9RSEosTk1RAPJ9PJ2CFYCSGXn5OfnplTwMrGmJOcWpvFCam0HRzTXE2UM3tSA_PrW4IDE5NS-1JN7Zz9DQwtjSyMLEzNGYGDUAXr8rOA</recordid><startdate>20240726</startdate><enddate>20240726</enddate><creator>LUO ZHENGSHENG</creator><creator>ZHU MING</creator><creator>XU JUHONG</creator><creator>XU DAWEI</creator><creator>ZHU PENGCHENG</creator><creator>ZHOU YIQUN</creator><creator>SHEN SONGSONG</creator><creator>WANG QINGXIANG</creator><creator>YU ZHENGNING</creator><creator>FANG CHENG</creator><creator>HE JUNXING</creator><scope>EVB</scope></search><sort><creationdate>20240726</creationdate><title>Element detection method based on LIBS technology</title><author>LUO ZHENGSHENG ; ZHU MING ; XU JUHONG ; XU DAWEI ; ZHU PENGCHENG ; ZHOU YIQUN ; SHEN SONGSONG ; WANG QINGXIANG ; YU ZHENGNING ; FANG CHENG ; HE JUNXING</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN118392846A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LUO ZHENGSHENG</creatorcontrib><creatorcontrib>ZHU MING</creatorcontrib><creatorcontrib>XU JUHONG</creatorcontrib><creatorcontrib>XU DAWEI</creatorcontrib><creatorcontrib>ZHU PENGCHENG</creatorcontrib><creatorcontrib>ZHOU YIQUN</creatorcontrib><creatorcontrib>SHEN SONGSONG</creatorcontrib><creatorcontrib>WANG QINGXIANG</creatorcontrib><creatorcontrib>YU ZHENGNING</creatorcontrib><creatorcontrib>FANG CHENG</creatorcontrib><creatorcontrib>HE JUNXING</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LUO ZHENGSHENG</au><au>ZHU MING</au><au>XU JUHONG</au><au>XU DAWEI</au><au>ZHU PENGCHENG</au><au>ZHOU YIQUN</au><au>SHEN SONGSONG</au><au>WANG QINGXIANG</au><au>YU ZHENGNING</au><au>FANG CHENG</au><au>HE JUNXING</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Element detection method based on LIBS technology</title><date>2024-07-26</date><risdate>2024</risdate><abstract>The invention provides an element detection method based on an LIBS (laser-induced breakdown spectroscopy) technology, which comprises the following steps: (A1) segmenting a sample scanning track to enable each segment to be linear; (A2) corresponding to each segment Li, the distance hi between the light emitting unit and the sample is adjusted according to the step length, a data set (Iij, hij) corresponding to each excitation point in the segment is obtained, Iij is a spectral signal obtained at the excitation point, hij is the distance between the light emitting unit and the sample at the excitation point, i = 1, 2... M, j = 1, 2... N, and M and N are integers greater than 2; according to the M data sets (Iij, hij), the optimal distance hi0 corresponding to the segment Li is obtained; (A3) adjusting the distance between the light emitting unit and the sample to hi0, and scanning to obtain a spectral signal Ii corresponding to the segment Li; (A4) obtaining the optimal light intensity I according to the spe</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Element detection method based on LIBS technology |
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