Method for filling Spanner database in test environment

Method for filling Spanner database in test environment

A method of populating a test environment (106) for integrated testing of a production database (102). The production database includes a plurality of tables and may be represented by a directed acyclic graph (DAG) (132), where each of the plurality of tables is represented by a respective node of t...

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Hauptverfasser: GUO DANHAO, CARLOS ARGUELLES, BADRINATH, SRINATH, MAAS EVERETT
Format: Patent
Sprache:chi ; eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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creator GUO DANHAO
CARLOS ARGUELLES
BADRINATH, SRINATH
MAAS EVERETT
description A method of populating a test environment (106) for integrated testing of a production database (102). The production database includes a plurality of tables and may be represented by a directed acyclic graph (DAG) (132), where each of the plurality of tables is represented by a respective node of the DAG, and pattern level constraints (134) of the plurality of tables are represented by edges of the DAG. The method may involve constructing a DAG (142); performing topology sequencing on the plurality of tables of the production database according to the DAG; randomly generating test data according to the pattern level constraints of the plurality of tables (146); and populating the randomly generated test data into the test environment according to the topological sequence of the plurality of tables. 一种填充测试环境(106)以供生产数据库(102)的集成测试的方法。该生产数据库包括多个表，并且可以由有向无环图(DAG)(132)表示，其中该多个表中的每一个是由该DAG的相应节点表示的，并且该多个表的模式级约束(134)是由该DAG的边表示的。该方法可以涉及构建DAG(142)；根据该DAG对该生产数据库的该多个表进行拓扑定序；根据该多个表的该模式级约束随机生成测试数据(146)；以及根据该多个表的该拓扑定序将该随机生
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title Method for filling Spanner database in test environment
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