Test case generation method and device

The invention provides a test case generation method and device. The test case generation method comprises the steps of obtaining a test request of a newly added function module of a service system; obtaining at least two associated documents of the newly added function module according to the test...

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Bibliographische Detailangaben
Hauptverfasser:	ZHANG YUXIN, OU XIANWU, KUECHLIN, LIU YUANSHENG, MAO LIJUN, HUANG ZHENXIONG, ZHAN HAOYU, CAI DONGPING, LI ZHENGXIN, CHEN KAIHAO, XU LI, CHI BAOCHENG, ZHANG BIN, HUANG TING, LIANG YUYI, XIE JUNQIANG, WANG YU, HUANG JUN, HUANG XU, HUANG JIANXIANG, TENG RUI, CHEN QUANFU, WU DONG, LI JINFU, LIU GUOXIN, XU XUN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	The invention provides a test case generation method and device. The test case generation method comprises the steps of obtaining a test request of a newly added function module of a service system; obtaining at least two associated documents of the newly added function module according to the test request, wherein the at least two associated documents comprise at least two types of documents in a UED graph, an interface document and a database script; obtaining test case generation schemes of the at least two associated documents; and generating a test case set of the newly added function module based on the test case generation scheme. When the test request is obtained, the at least two associated documents of the newly-added function module are obtained, the test case set of the newly-added function module is generated according to the at least two associated documents and the corresponding test case generation scheme, the test case set can be automatically generated by automatically identifying the associ