Least square method-based improvement method for plane size measurement of point cloud

The invention discloses a method for improving point cloud plane size measurement based on a least square method, relates to the technical field of image processing, and solves the technical problem that the precision is reduced when point cloud fluctuates and is missing. The algorithm comprises the...

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Hauptverfasser: WAN YAGUANG, LI HUITIAN, QI LIANGCHUN, SHU QIHUI, GUO TIE, ZHANG JUNYU, LUO QIRUI, TANG JUNYU, LIU CHEN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a method for improving point cloud plane size measurement based on a least square method, relates to the technical field of image processing, and solves the technical problem that the precision is reduced when point cloud fluctuates and is missing. The algorithm comprises the following steps of: converting a plane equation, namely Ax + By + Cz + D = 0, fitted by a point cloud to be measured into # imgabs0 # imgabs1 #, and solving four parameters A, B, C and D in the plane equation fitted by the point cloud through a least square method; and substituting the parameters A, B, C and D into # imgabs2, fitting a fluctuating point cloud plane into a flat mathematical plane, and carrying out a lifting method for measuring the plane size of the point cloud based on a least square method. The method is applied to a production logistics line of point cloud distance measurement, the calculation speed is high, and the influence of point cloud fluctuation and point cloud missing on the measurement