Multi-type microwave signal source general metrological verification system construction method and computer equipment

The invention discloses a multi-type microwave signal source general metrological verification system construction method, which comprises the following steps of S1, analyzing a general metrological demand covering all detected objects by adopting a qualitative analysis method according to a signal...

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Hauptverfasser: CHEN MINYA, LI YUHUI, ZHANG CHUNLIANG, ZHANG HAIRUI, SUN YUNDE, FENG YADONG, MOU YIZHE, ZHANG QIANPING, SHI CHENHANG
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creator CHEN MINYA
LI YUHUI
ZHANG CHUNLIANG
ZHANG HAIRUI
SUN YUNDE
FENG YADONG
MOU YIZHE
ZHANG QIANPING
SHI CHENHANG
description The invention discloses a multi-type microwave signal source general metrological verification system construction method, which comprises the following steps of S1, analyzing a general metrological demand covering all detected objects by adopting a qualitative analysis method according to a signal type and a highest technical index satisfaction principle; s2, selecting a bus technology in the field of microwave signal source metrological verification by applying an exploration research method, designing an implementation scheme of a general metrological verification system, and solving the defects of a traditional instrument metrological verification scheme; s3, verifying the feasibility and reliability of a software and hardware design scheme in the general metrological verification system, the stability of a measurement process and the accuracy of a measurement result by adopting an experimental verification method; and S4, firstly analyzing and then synthesizing, and incorporating a special metrological v
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN118244181A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN118244181A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN118244181A3</originalsourceid><addsrcrecordid>eNqNjTEOwjAQBNNQIOAPxwNSGFKkRRGIBir6yHIu4STbZ-xzUH6PhXgA1e6ORtp1Nd-yFaplCQiOTOS3nhESTV5bSJyjQZjQYyzToUS2PJEpY8ZIY2lC7CEtSdCBYZ8kZvNlxX7yANoPhbuQBSPgK1Nw6GVbrUZtE-5-uan2l_Oju9YYuMcUtCmf0nd3pdpD06hWnY7_OB8gB0dd</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Multi-type microwave signal source general metrological verification system construction method and computer equipment</title><source>esp@cenet</source><creator>CHEN MINYA ; LI YUHUI ; ZHANG CHUNLIANG ; ZHANG HAIRUI ; SUN YUNDE ; FENG YADONG ; MOU YIZHE ; ZHANG QIANPING ; SHI CHENHANG</creator><creatorcontrib>CHEN MINYA ; LI YUHUI ; ZHANG CHUNLIANG ; ZHANG HAIRUI ; SUN YUNDE ; FENG YADONG ; MOU YIZHE ; ZHANG QIANPING ; SHI CHENHANG</creatorcontrib><description>The invention discloses a multi-type microwave signal source general metrological verification system construction method, which comprises the following steps of S1, analyzing a general metrological demand covering all detected objects by adopting a qualitative analysis method according to a signal type and a highest technical index satisfaction principle; s2, selecting a bus technology in the field of microwave signal source metrological verification by applying an exploration research method, designing an implementation scheme of a general metrological verification system, and solving the defects of a traditional instrument metrological verification scheme; s3, verifying the feasibility and reliability of a software and hardware design scheme in the general metrological verification system, the stability of a measurement process and the accuracy of a measurement result by adopting an experimental verification method; and S4, firstly analyzing and then synthesizing, and incorporating a special metrological v</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240625&amp;DB=EPODOC&amp;CC=CN&amp;NR=118244181A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240625&amp;DB=EPODOC&amp;CC=CN&amp;NR=118244181A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHEN MINYA</creatorcontrib><creatorcontrib>LI YUHUI</creatorcontrib><creatorcontrib>ZHANG CHUNLIANG</creatorcontrib><creatorcontrib>ZHANG HAIRUI</creatorcontrib><creatorcontrib>SUN YUNDE</creatorcontrib><creatorcontrib>FENG YADONG</creatorcontrib><creatorcontrib>MOU YIZHE</creatorcontrib><creatorcontrib>ZHANG QIANPING</creatorcontrib><creatorcontrib>SHI CHENHANG</creatorcontrib><title>Multi-type microwave signal source general metrological verification system construction method and computer equipment</title><description>The invention discloses a multi-type microwave signal source general metrological verification system construction method, which comprises the following steps of S1, analyzing a general metrological demand covering all detected objects by adopting a qualitative analysis method according to a signal type and a highest technical index satisfaction principle; s2, selecting a bus technology in the field of microwave signal source metrological verification by applying an exploration research method, designing an implementation scheme of a general metrological verification system, and solving the defects of a traditional instrument metrological verification scheme; s3, verifying the feasibility and reliability of a software and hardware design scheme in the general metrological verification system, the stability of a measurement process and the accuracy of a measurement result by adopting an experimental verification method; and S4, firstly analyzing and then synthesizing, and incorporating a special metrological v</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjTEOwjAQBNNQIOAPxwNSGFKkRRGIBir6yHIu4STbZ-xzUH6PhXgA1e6ORtp1Nd-yFaplCQiOTOS3nhESTV5bSJyjQZjQYyzToUS2PJEpY8ZIY2lC7CEtSdCBYZ8kZvNlxX7yANoPhbuQBSPgK1Nw6GVbrUZtE-5-uan2l_Oju9YYuMcUtCmf0nd3pdpD06hWnY7_OB8gB0dd</recordid><startdate>20240625</startdate><enddate>20240625</enddate><creator>CHEN MINYA</creator><creator>LI YUHUI</creator><creator>ZHANG CHUNLIANG</creator><creator>ZHANG HAIRUI</creator><creator>SUN YUNDE</creator><creator>FENG YADONG</creator><creator>MOU YIZHE</creator><creator>ZHANG QIANPING</creator><creator>SHI CHENHANG</creator><scope>EVB</scope></search><sort><creationdate>20240625</creationdate><title>Multi-type microwave signal source general metrological verification system construction method and computer equipment</title><author>CHEN MINYA ; LI YUHUI ; ZHANG CHUNLIANG ; ZHANG HAIRUI ; SUN YUNDE ; FENG YADONG ; MOU YIZHE ; ZHANG QIANPING ; SHI CHENHANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN118244181A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHEN MINYA</creatorcontrib><creatorcontrib>LI YUHUI</creatorcontrib><creatorcontrib>ZHANG CHUNLIANG</creatorcontrib><creatorcontrib>ZHANG HAIRUI</creatorcontrib><creatorcontrib>SUN YUNDE</creatorcontrib><creatorcontrib>FENG YADONG</creatorcontrib><creatorcontrib>MOU YIZHE</creatorcontrib><creatorcontrib>ZHANG QIANPING</creatorcontrib><creatorcontrib>SHI CHENHANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHEN MINYA</au><au>LI YUHUI</au><au>ZHANG CHUNLIANG</au><au>ZHANG HAIRUI</au><au>SUN YUNDE</au><au>FENG YADONG</au><au>MOU YIZHE</au><au>ZHANG QIANPING</au><au>SHI CHENHANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Multi-type microwave signal source general metrological verification system construction method and computer equipment</title><date>2024-06-25</date><risdate>2024</risdate><abstract>The invention discloses a multi-type microwave signal source general metrological verification system construction method, which comprises the following steps of S1, analyzing a general metrological demand covering all detected objects by adopting a qualitative analysis method according to a signal type and a highest technical index satisfaction principle; s2, selecting a bus technology in the field of microwave signal source metrological verification by applying an exploration research method, designing an implementation scheme of a general metrological verification system, and solving the defects of a traditional instrument metrological verification scheme; s3, verifying the feasibility and reliability of a software and hardware design scheme in the general metrological verification system, the stability of a measurement process and the accuracy of a measurement result by adopting an experimental verification method; and S4, firstly analyzing and then synthesizing, and incorporating a special metrological v</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Multi-type microwave signal source general metrological verification system construction method and computer equipment
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T15%3A32%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHEN%20MINYA&rft.date=2024-06-25&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN118244181A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true