Optical article inspection apparatus and method
An inspection apparatus configured for inspecting optical articles includes an inspection chamber having an inspection station and a holding chamber having an indexable holding platform having a plurality of holding slots, each holding slot configured for receiving a holder adapted to secure an opti...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | KROOS ALEXANDER HAZLE JOSHUA ASCUCRAFT LINDA MURPHY NICK BEAMER WILLIAM BLACKBURN, FORREST |
description | An inspection apparatus configured for inspecting optical articles includes an inspection chamber having an inspection station and a holding chamber having an indexable holding platform having a plurality of holding slots, each holding slot configured for receiving a holder adapted to secure an optical article. The indexable holding platform is configured to index the selected holder to an inspection position. The inspection apparatus further includes a gripper mechanism configured to transfer the selected holder from the inspection position to the inspection chamber. A method of inspecting an optical article using the inspection apparatus is also disclosed.
一种被配置用于检查光学制品的检查设备,包括具有检查工位的检查室以及具有可转位保持平台的保持室,该可转位保持平台具有多个保持狭槽,每个保持狭槽被配置用于接纳适于固定光学制品的保持器。可转位保持平台被配置成将选定的保持器转位到检查位置。检查设备进一步包括夹持器机构,该夹持器机构被配置用于将该选定的保持器从检查位置传送到检查室。还披露了一种使用检查设备来检查光学制品的方法。 |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN118159823A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN118159823A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN118159823A3</originalsourceid><addsrcrecordid>eNrjZND3LyjJTE7MUUgsAtI5qQqZecUFqcklmfl5CokFBYlFiSWlxQqJeSkKuaklGfkpPAysaYk5xam8UJqbQdHNNcTZQze1ID8-tbggMTk1L7Uk3tnP0NDC0NTSwsjY0ZgYNQBKRysz</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Optical article inspection apparatus and method</title><source>esp@cenet</source><creator>KROOS ALEXANDER ; HAZLE JOSHUA ; ASCUCRAFT LINDA ; MURPHY NICK ; BEAMER WILLIAM ; BLACKBURN, FORREST</creator><creatorcontrib>KROOS ALEXANDER ; HAZLE JOSHUA ; ASCUCRAFT LINDA ; MURPHY NICK ; BEAMER WILLIAM ; BLACKBURN, FORREST</creatorcontrib><description>An inspection apparatus configured for inspecting optical articles includes an inspection chamber having an inspection station and a holding chamber having an indexable holding platform having a plurality of holding slots, each holding slot configured for receiving a holder adapted to secure an optical article. The indexable holding platform is configured to index the selected holder to an inspection position. The inspection apparatus further includes a gripper mechanism configured to transfer the selected holder from the inspection position to the inspection chamber. A method of inspecting an optical article using the inspection apparatus is also disclosed.
一种被配置用于检查光学制品的检查设备,包括具有检查工位的检查室以及具有可转位保持平台的保持室,该可转位保持平台具有多个保持狭槽,每个保持狭槽被配置用于接纳适于固定光学制品的保持器。可转位保持平台被配置成将选定的保持器转位到检查位置。检查设备进一步包括夹持器机构,该夹持器机构被配置用于将该选定的保持器从检查位置传送到检查室。还披露了一种使用检查设备来检查光学制品的方法。</description><language>chi ; eng</language><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240607&DB=EPODOC&CC=CN&NR=118159823A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25566,76549</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240607&DB=EPODOC&CC=CN&NR=118159823A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KROOS ALEXANDER</creatorcontrib><creatorcontrib>HAZLE JOSHUA</creatorcontrib><creatorcontrib>ASCUCRAFT LINDA</creatorcontrib><creatorcontrib>MURPHY NICK</creatorcontrib><creatorcontrib>BEAMER WILLIAM</creatorcontrib><creatorcontrib>BLACKBURN, FORREST</creatorcontrib><title>Optical article inspection apparatus and method</title><description>An inspection apparatus configured for inspecting optical articles includes an inspection chamber having an inspection station and a holding chamber having an indexable holding platform having a plurality of holding slots, each holding slot configured for receiving a holder adapted to secure an optical article. The indexable holding platform is configured to index the selected holder to an inspection position. The inspection apparatus further includes a gripper mechanism configured to transfer the selected holder from the inspection position to the inspection chamber. A method of inspecting an optical article using the inspection apparatus is also disclosed.
一种被配置用于检查光学制品的检查设备,包括具有检查工位的检查室以及具有可转位保持平台的保持室,该可转位保持平台具有多个保持狭槽,每个保持狭槽被配置用于接纳适于固定光学制品的保持器。可转位保持平台被配置成将选定的保持器转位到检查位置。检查设备进一步包括夹持器机构,该夹持器机构被配置用于将该选定的保持器从检查位置传送到检查室。还披露了一种使用检查设备来检查光学制品的方法。</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZND3LyjJTE7MUUgsAtI5qQqZecUFqcklmfl5CokFBYlFiSWlxQqJeSkKuaklGfkpPAysaYk5xam8UJqbQdHNNcTZQze1ID8-tbggMTk1L7Uk3tnP0NDC0NTSwsjY0ZgYNQBKRysz</recordid><startdate>20240607</startdate><enddate>20240607</enddate><creator>KROOS ALEXANDER</creator><creator>HAZLE JOSHUA</creator><creator>ASCUCRAFT LINDA</creator><creator>MURPHY NICK</creator><creator>BEAMER WILLIAM</creator><creator>BLACKBURN, FORREST</creator><scope>EVB</scope></search><sort><creationdate>20240607</creationdate><title>Optical article inspection apparatus and method</title><author>KROOS ALEXANDER ; HAZLE JOSHUA ; ASCUCRAFT LINDA ; MURPHY NICK ; BEAMER WILLIAM ; BLACKBURN, FORREST</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN118159823A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><toplevel>online_resources</toplevel><creatorcontrib>KROOS ALEXANDER</creatorcontrib><creatorcontrib>HAZLE JOSHUA</creatorcontrib><creatorcontrib>ASCUCRAFT LINDA</creatorcontrib><creatorcontrib>MURPHY NICK</creatorcontrib><creatorcontrib>BEAMER WILLIAM</creatorcontrib><creatorcontrib>BLACKBURN, FORREST</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KROOS ALEXANDER</au><au>HAZLE JOSHUA</au><au>ASCUCRAFT LINDA</au><au>MURPHY NICK</au><au>BEAMER WILLIAM</au><au>BLACKBURN, FORREST</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Optical article inspection apparatus and method</title><date>2024-06-07</date><risdate>2024</risdate><abstract>An inspection apparatus configured for inspecting optical articles includes an inspection chamber having an inspection station and a holding chamber having an indexable holding platform having a plurality of holding slots, each holding slot configured for receiving a holder adapted to secure an optical article. The indexable holding platform is configured to index the selected holder to an inspection position. The inspection apparatus further includes a gripper mechanism configured to transfer the selected holder from the inspection position to the inspection chamber. A method of inspecting an optical article using the inspection apparatus is also disclosed.
一种被配置用于检查光学制品的检查设备,包括具有检查工位的检查室以及具有可转位保持平台的保持室,该可转位保持平台具有多个保持狭槽,每个保持狭槽被配置用于接纳适于固定光学制品的保持器。可转位保持平台被配置成将选定的保持器转位到检查位置。检查设备进一步包括夹持器机构,该夹持器机构被配置用于将该选定的保持器从检查位置传送到检查室。还披露了一种使用检查设备来检查光学制品的方法。</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN118159823A |
source | esp@cenet |
title | Optical article inspection apparatus and method |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-18T13%3A00%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KROOS%20ALEXANDER&rft.date=2024-06-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN118159823A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |