Feature extraction method, system and device based on X-ray contrast image

The invention discloses a feature extraction method, system and device based on an X-ray contrast image, and the method comprises the steps: obtaining the contrast images of a to-be-detected sample, including an absorption contrast image, a differential phase contrast image and a dark field contrast...

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Hauptverfasser: KUANG CUIFANG, CAO WEN, BAO YIJUN, TIAN ZONGHAN, YANG HAOBIN, TAO SIWEI, XU YUESHU, BAI LING, LIU XU
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a feature extraction method, system and device based on an X-ray contrast image, and the method comprises the steps: obtaining the contrast images of a to-be-detected sample, including an absorption contrast image, a differential phase contrast image and a dark field contrast image; carrying out preprocessing and enhancement to obtain an enhanced absorption contrast image, a differential phase contrast image and a dark field contrast image; edge features and texture features corresponding to the absorption contrast image, the differential phase contrast image and the dark field contrast image are obtained by extracting the edge features and the texture features; and performing shape feature extraction based on the edge features corresponding to the absorption contrast image, the differential phase contrast image and the dark field contrast image to obtain shape features corresponding to the absorption contrast image, the differential phase contrast image and the dark field contrast ima