Displacement table precision measurement method and device based on quantum weak measurement
The invention relates to the technical field of precision measurement, in particular to a displacement table precision measurement method and device based on quantum weak measurement. The device sequentially comprises a light source, a front selection module, a Mach-Zehnder interferometer and a rear...
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creator | LI WENKUI ZOU ZHIXIN LI XIAOCHUN |
description | The invention relates to the technical field of precision measurement, in particular to a displacement table precision measurement method and device based on quantum weak measurement. The device sequentially comprises a light source, a front selection module, a Mach-Zehnder interferometer and a rear selection measurement module in the light path propagation direction. Two orthogonal polarization states of light are used as eigenstates of a system, a Gaussian spectral form of a broadband light source (SLD) is used as a pointer state to generate weak coupling with a to-be-detected tiny phase, a signal is amplified by selecting proper front and back selection states, and phase detection is realized by momentum movement of an emergent pointer. The weak value amplification technology is adopted, the tiny physical effect is amplified at the cost of losing part of the detection probability, the sensitivity is improved, the measurement precision is also greatly improved, and the method is particularly suitable for me |
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The device sequentially comprises a light source, a front selection module, a Mach-Zehnder interferometer and a rear selection measurement module in the light path propagation direction. Two orthogonal polarization states of light are used as eigenstates of a system, a Gaussian spectral form of a broadband light source (SLD) is used as a pointer state to generate weak coupling with a to-be-detected tiny phase, a signal is amplified by selecting proper front and back selection states, and phase detection is realized by momentum movement of an emergent pointer. 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language | chi ; eng |
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subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
title | Displacement table precision measurement method and device based on quantum weak measurement |
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