Large grounding grid impedance tester simulation verification circuit and method

Large grounding grid impedance tester simulation verification circuit and method

The invention provides a large grounding grid impedance tester simulation verification circuit and method, and belongs to the technical field of large grounding grid impedance tester verification. The circuit comprises: a current/voltage conversion circuit for converting a test current into a signal...

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Hauptverfasser: WANG XINGLIANG, TANG JUN, XIAO PENG, ZHANG TIANTIAN, ZHANG LUN, ZHU PENGFEI, ZOU HAO, DAI CHONGJING, YANG XUEMEI, LI QIANG, BAI LINGZHI, YANG KE
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator WANG XINGLIANG
TANG JUN
XIAO PENG
ZHANG TIANTIAN
ZHANG LUN
ZHU PENGFEI
ZOU HAO
DAI CHONGJING
YANG XUEMEI
LI QIANG
BAI LINGZHI
YANG KE
description The invention provides a large grounding grid impedance tester simulation verification circuit and method, and belongs to the technical field of large grounding grid impedance tester verification. The circuit comprises: a current/voltage conversion circuit for converting a test current into a signal V1; the phase shift circuit is used for converting the signal V1 into a signal V2; the digital-to-analog conversion circuit is used for converting the signal V1 into a sinusoidal signal V3; the first true virtual value conversion circuit is used for converting the signal V3 into a direct current signal Vs; the integrator circuit is used for integrating the signal Vs and the direct-current signal Vf to obtain a direct-current signal V5; the multiplier circuit multiplies the signal V5 and the signal V2 to obtain a direct current signal V6; the amplifier circuit amplifies the signal V6 to obtain an output signal V0; the signal attenuation circuit attenuates the signal V0 to obtain a sinusoidal signal V4; and the seco
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN118091521A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN118091521A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN118091521A3</originalsourceid><addsrcrecordid>eNqNijEKAjEQANNYiPqH9QGCUQQt5VAsRCzsjyXZiwuXTUg2vl9BH2A1MzBTc79iCQShpCaeJXyMPXDM5FEcgVJVKlA5thGVk8CLCg_svuG4uMYKKB4i6TP5uZkMOFZa_Dgzy_Pp0V1WlFNPNaMjIe27m7X79cHuNva4_ed5A94gN9k</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Large grounding grid impedance tester simulation verification circuit and method</title><source>esp@cenet</source><creator>WANG XINGLIANG ; TANG JUN ; XIAO PENG ; ZHANG TIANTIAN ; ZHANG LUN ; ZHU PENGFEI ; ZOU HAO ; DAI CHONGJING ; YANG XUEMEI ; LI QIANG ; BAI LINGZHI ; YANG KE</creator><creatorcontrib>WANG XINGLIANG ; TANG JUN ; XIAO PENG ; ZHANG TIANTIAN ; ZHANG LUN ; ZHU PENGFEI ; ZOU HAO ; DAI CHONGJING ; YANG XUEMEI ; LI QIANG ; BAI LINGZHI ; YANG KE</creatorcontrib><description>The invention provides a large grounding grid impedance tester simulation verification circuit and method, and belongs to the technical field of large grounding grid impedance tester verification. The circuit comprises: a current/voltage conversion circuit for converting a test current into a signal V1; the phase shift circuit is used for converting the signal V1 into a signal V2; the digital-to-analog conversion circuit is used for converting the signal V1 into a sinusoidal signal V3; the first true virtual value conversion circuit is used for converting the signal V3 into a direct current signal Vs; the integrator circuit is used for integrating the signal Vs and the direct-current signal Vf to obtain a direct-current signal V5; the multiplier circuit multiplies the signal V5 and the signal V2 to obtain a direct current signal V6; the amplifier circuit amplifies the signal V6 to obtain an output signal V0; the signal attenuation circuit attenuates the signal V0 to obtain a sinusoidal signal V4; and the seco</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240528&amp;DB=EPODOC&amp;CC=CN&amp;NR=118091521A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240528&amp;DB=EPODOC&amp;CC=CN&amp;NR=118091521A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WANG XINGLIANG</creatorcontrib><creatorcontrib>TANG JUN</creatorcontrib><creatorcontrib>XIAO PENG</creatorcontrib><creatorcontrib>ZHANG TIANTIAN</creatorcontrib><creatorcontrib>ZHANG LUN</creatorcontrib><creatorcontrib>ZHU PENGFEI</creatorcontrib><creatorcontrib>ZOU HAO</creatorcontrib><creatorcontrib>DAI CHONGJING</creatorcontrib><creatorcontrib>YANG XUEMEI</creatorcontrib><creatorcontrib>LI QIANG</creatorcontrib><creatorcontrib>BAI LINGZHI</creatorcontrib><creatorcontrib>YANG KE</creatorcontrib><title>Large grounding grid impedance tester simulation verification circuit and method</title><description>The invention provides a large grounding grid impedance tester simulation verification circuit and method, and belongs to the technical field of large grounding grid impedance tester verification. The circuit comprises: a current/voltage conversion circuit for converting a test current into a signal V1; the phase shift circuit is used for converting the signal V1 into a signal V2; the digital-to-analog conversion circuit is used for converting the signal V1 into a sinusoidal signal V3; the first true virtual value conversion circuit is used for converting the signal V3 into a direct current signal Vs; the integrator circuit is used for integrating the signal Vs and the direct-current signal Vf to obtain a direct-current signal V5; the multiplier circuit multiplies the signal V5 and the signal V2 to obtain a direct current signal V6; the amplifier circuit amplifies the signal V6 to obtain an output signal V0; the signal attenuation circuit attenuates the signal V0 to obtain a sinusoidal signal V4; and the seco</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNijEKAjEQANNYiPqH9QGCUQQt5VAsRCzsjyXZiwuXTUg2vl9BH2A1MzBTc79iCQShpCaeJXyMPXDM5FEcgVJVKlA5thGVk8CLCg_svuG4uMYKKB4i6TP5uZkMOFZa_Dgzy_Pp0V1WlFNPNaMjIe27m7X79cHuNva4_ed5A94gN9k</recordid><startdate>20240528</startdate><enddate>20240528</enddate><creator>WANG XINGLIANG</creator><creator>TANG JUN</creator><creator>XIAO PENG</creator><creator>ZHANG TIANTIAN</creator><creator>ZHANG LUN</creator><creator>ZHU PENGFEI</creator><creator>ZOU HAO</creator><creator>DAI CHONGJING</creator><creator>YANG XUEMEI</creator><creator>LI QIANG</creator><creator>BAI LINGZHI</creator><creator>YANG KE</creator><scope>EVB</scope></search><sort><creationdate>20240528</creationdate><title>Large grounding grid impedance tester simulation verification circuit and method</title><author>WANG XINGLIANG ; TANG JUN ; XIAO PENG ; ZHANG TIANTIAN ; ZHANG LUN ; ZHU PENGFEI ; ZOU HAO ; DAI CHONGJING ; YANG XUEMEI ; LI QIANG ; BAI LINGZHI ; YANG KE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN118091521A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WANG XINGLIANG</creatorcontrib><creatorcontrib>TANG JUN</creatorcontrib><creatorcontrib>XIAO PENG</creatorcontrib><creatorcontrib>ZHANG TIANTIAN</creatorcontrib><creatorcontrib>ZHANG LUN</creatorcontrib><creatorcontrib>ZHU PENGFEI</creatorcontrib><creatorcontrib>ZOU HAO</creatorcontrib><creatorcontrib>DAI CHONGJING</creatorcontrib><creatorcontrib>YANG XUEMEI</creatorcontrib><creatorcontrib>LI QIANG</creatorcontrib><creatorcontrib>BAI LINGZHI</creatorcontrib><creatorcontrib>YANG KE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WANG XINGLIANG</au><au>TANG JUN</au><au>XIAO PENG</au><au>ZHANG TIANTIAN</au><au>ZHANG LUN</au><au>ZHU PENGFEI</au><au>ZOU HAO</au><au>DAI CHONGJING</au><au>YANG XUEMEI</au><au>LI QIANG</au><au>BAI LINGZHI</au><au>YANG KE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Large grounding grid impedance tester simulation verification circuit and method</title><date>2024-05-28</date><risdate>2024</risdate><abstract>The invention provides a large grounding grid impedance tester simulation verification circuit and method, and belongs to the technical field of large grounding grid impedance tester verification. The circuit comprises: a current/voltage conversion circuit for converting a test current into a signal V1; the phase shift circuit is used for converting the signal V1 into a signal V2; the digital-to-analog conversion circuit is used for converting the signal V1 into a sinusoidal signal V3; the first true virtual value conversion circuit is used for converting the signal V3 into a direct current signal Vs; the integrator circuit is used for integrating the signal Vs and the direct-current signal Vf to obtain a direct-current signal V5; the multiplier circuit multiplies the signal V5 and the signal V2 to obtain a direct current signal V6; the amplifier circuit amplifies the signal V6 to obtain an output signal V0; the signal attenuation circuit attenuates the signal V0 to obtain a sinusoidal signal V4; and the seco</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Large grounding grid impedance tester simulation verification circuit and method
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