Test bench and method for testing electronic component

A test socket and method for testing an electronic component, in particular for testing a high-power semiconductor component, comprising: a plurality of contact elements adapted to contact the electronic component; a holder block for holding and arranging a plurality of contact elements wherein each...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MEDER CHRISTOPH, ENGELBRECHT, STEFAN, POTZINGER, JOHANN, WAGNER MARKUS
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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