Test bench and method for testing electronic component

A test socket and method for testing an electronic component, in particular for testing a high-power semiconductor component, comprising: a plurality of contact elements adapted to contact the electronic component; a holder block for holding and arranging a plurality of contact elements wherein each of the plurality of contact elements comprises at least one conductive surface portion; wherein the holder block comprises a plurality of electrically conductive support portions for supporting the conductive surface portions of the plurality of contact elements, and wherein the plurality of support portions are in electrical contact with the plurality of conductive surface portions by supporting the conductive surface portions, and wherein the holder block at least partially transmits a test signal. 一种用于对电子部件进行测试的测试座和方法，特别是用于对高功率半导体部件进行测试的测试座和方法，包括：适于接触电子部件的多个接触元件；用于保持和布置多个接触元件的保持器块，其中，多个接触元件中的每个接触元件均包括至少一个传导表面部分；其中，保持器块包括用于对多个接触元件的传导表面部分进行支撑的多个电传导支撑部分，其中，多个支撑部分通过对传导表面部分进行支撑而与多个传导表面部分电接触，并且其中，保持器块至少部分地传输测试信号。