Element matching and reporting system and method
The invention provides an element matching and reporting method, which comprises the following steps of: analyzing a three-dimensional file to obtain a plurality of features; analyzing the plurality of features according to the feature analysis parameters to find out at least one element feature; ju...
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creator | CHEN PEIJUN CHEN JUNJIE LIN JUNHONG HU KEMIN |
description | The invention provides an element matching and reporting method, which comprises the following steps of: analyzing a three-dimensional file to obtain a plurality of features; analyzing the plurality of features according to the feature analysis parameters to find out at least one element feature; judging whether the at least one element feature corresponds to an element or not according to the feature judgment parameter; when at least one element feature corresponds to an element, positioning the element; after the component is positioned, the component is measured to output a measurement report.
本发明提出一种元件匹配和报告方法,其包含以下步骤:剖析三维档案,以得出复数特征;依据特征分析参数,分析复数特征,以找出至少一元件特征;依据特征判断参数,判断至少一元件特征是否对应为元件;当至少一元件特征对应为元件时,对元件进行定位;在元件定位以后,对元件进行量测以输出量测报告。 |
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本发明提出一种元件匹配和报告方法,其包含以下步骤:剖析三维档案,以得出复数特征;依据特征分析参数,分析复数特征,以找出至少一元件特征;依据特征判断参数,判断至少一元件特征是否对应为元件;当至少一元件特征对应为元件时,对元件进行定位;在元件定位以后,对元件进行量测以输出量测报告。</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240514&DB=EPODOC&CC=CN&NR=118031867A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240514&DB=EPODOC&CC=CN&NR=118031867A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHEN PEIJUN</creatorcontrib><creatorcontrib>CHEN JUNJIE</creatorcontrib><creatorcontrib>LIN JUNHONG</creatorcontrib><creatorcontrib>HU KEMIN</creatorcontrib><title>Element matching and reporting system and method</title><description>The invention provides an element matching and reporting method, which comprises the following steps of: analyzing a three-dimensional file to obtain a plurality of features; analyzing the plurality of features according to the feature analysis parameters to find out at least one element feature; judging whether the at least one element feature corresponds to an element or not according to the feature judgment parameter; when at least one element feature corresponds to an element, positioning the element; after the component is positioned, the component is measured to output a measurement report.
本发明提出一种元件匹配和报告方法,其包含以下步骤:剖析三维档案,以得出复数特征;依据特征分析参数,分析复数特征,以找出至少一元件特征;依据特征判断参数,判断至少一元件特征是否对应为元件;当至少一元件特征对应为元件时,对元件进行定位;在元件定位以后,对元件进行量测以输出量测报告。</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDBwzUnNTc0rUchNLEnOyMxLV0jMS1EoSi3ILyoB8Yori0tSc8GCuaklGfkpPAysaYk5xam8UJqbQdHNNcTZQxeoJT61uCAxOTUvtSTe2c_Q0MLA2NDCzNzRmBg1AGRgK1g</recordid><startdate>20240514</startdate><enddate>20240514</enddate><creator>CHEN PEIJUN</creator><creator>CHEN JUNJIE</creator><creator>LIN JUNHONG</creator><creator>HU KEMIN</creator><scope>EVB</scope></search><sort><creationdate>20240514</creationdate><title>Element matching and reporting system and method</title><author>CHEN PEIJUN ; CHEN JUNJIE ; LIN JUNHONG ; HU KEMIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN118031867A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHEN PEIJUN</creatorcontrib><creatorcontrib>CHEN JUNJIE</creatorcontrib><creatorcontrib>LIN JUNHONG</creatorcontrib><creatorcontrib>HU KEMIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHEN PEIJUN</au><au>CHEN JUNJIE</au><au>LIN JUNHONG</au><au>HU KEMIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Element matching and reporting system and method</title><date>2024-05-14</date><risdate>2024</risdate><abstract>The invention provides an element matching and reporting method, which comprises the following steps of: analyzing a three-dimensional file to obtain a plurality of features; analyzing the plurality of features according to the feature analysis parameters to find out at least one element feature; judging whether the at least one element feature corresponds to an element or not according to the feature judgment parameter; when at least one element feature corresponds to an element, positioning the element; after the component is positioned, the component is measured to output a measurement report.
本发明提出一种元件匹配和报告方法,其包含以下步骤:剖析三维档案,以得出复数特征;依据特征分析参数,分析复数特征,以找出至少一元件特征;依据特征判断参数,判断至少一元件特征是否对应为元件;当至少一元件特征对应为元件时,对元件进行定位;在元件定位以后,对元件进行量测以输出量测报告。</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
title | Element matching and reporting system and method |
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