Embedded device dormancy wake-up test method

Embedded device dormancy wake-up test method

The invention discloses an embedded device dormancy wake-up test method, the method is suitable for a WIFI chip, and the method comprises the following steps: after receiving a dormancy wake-up test instruction sent by a main chip of a to-be-tested embedded device, repeatedly executing a test operat...

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Hauptverfasser: LIANG ZEYANG, DENG KEXI, WANG YU
Format: Patent
Sprache:chi ; eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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creator LIANG ZEYANG
DENG KEXI
WANG YU
description The invention discloses an embedded device dormancy wake-up test method, the method is suitable for a WIFI chip, and the method comprises the following steps: after receiving a dormancy wake-up test instruction sent by a main chip of a to-be-tested embedded device, repeatedly executing a test operation according to the dormancy wake-up test instruction until a preset test frequency is reached, the sleep wake-up test operation comprises the steps that a PSM frame is sent to a router when entering a sleep mode, so that the router broadcasts a Beacon frame after receiving the PSM frame, the Beacon frame comprises DTIM packets, an interrupt wake-up pin of a main chip of the embedded device to be tested is pulled up after a preset number of DTIM packets are received, and the main chip of the embedded device to be tested is subjected to sleep wake-up test. The to-be-tested embedded device is awakened, and the current test frequency is updated after the to-be-tested embedded device is awakened. By implementing the m
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title Embedded device dormancy wake-up test method
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