Secondary measure list processing method and device, storage medium and processor

The invention discloses a secondary measure list processing method and device, a storage medium and a processor. The method comprises the steps that standard templates of different types of secondary measure lists are determined in a template library of the secondary measure lists, and the standard...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: YANG RONGJIE, WANG QIDONG, SITU WEIYE, ZENG SONGHUA, JIANG JIONGFENG, KUAN-YING LIN
Format: Patent
Sprache:chi ; eng
Schlagworte:
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