Image quality evaluation method and device suitable for scanning electron microscope

The invention relates to the technical field of image processing and image quality evaluation, and discloses an image quality evaluation method and device suitable for a scanning electron microscope, and the method comprises the steps: obtaining a scanning electron microscope image database; judging whether the image of the scanning electron microscope image database is overexposed or not; and when overexposure does not exist in the images of the scanning electron microscope image database, obtaining an evaluation result of each scanning electron microscope image through a preset formula, and completing image quality evaluation of the scanning electron microscope. The method provided by the invention is simple and convenient to use, supports batch processing of images, can directly obtain a visual image quality score after calculation by using a formula, saves image evaluation time, and improves evaluation efficiency. 本发明涉及图像处理及图像质量评估技术领域，公开了一种适用于扫描电镜的图像质量评估方法及装置，本发明提供了一种适用于扫描电镜的图像质量评估方法，方法包括：获取扫描电镜图像数据库；判断扫描