Test piece and device and method for performing optical measurement by applying test piece

Test piece and device and method for performing optical measurement by applying test piece

According to the test piece and the device and method for optical measurement by using the test piece provided by the invention, the problem of light beam parameter test under the condition of limited space is solved, the test piece can be used under the two conditions of light transmission and ligh...

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Hauptverfasser: HUANG CHONGJI, PAN WENQIANG, ZHAO WEIWEI
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator HUANG CHONGJI
PAN WENQIANG
ZHAO WEIWEI
description According to the test piece and the device and method for optical measurement by using the test piece provided by the invention, the problem of light beam parameter test under the condition of limited space is solved, the test piece can be used under the two conditions of light transmission and light non-transmission, the precision of light spot measurement is further improved, and the measurement accuracy is improved. The minimum light spot size of the converged light beam can be accurately obtained, particularly, parameters such as the three-dimensional size and the Rayleigh range of the light beam to be measured can be obtained at the same time, and therefore the quality of the light beam can be judged. Besides, compared with the prior art, the cost of the technical scheme provided by the invention is extremely low, and the technical scheme provided by the invention is easily realized by modifying the existing device, so that the technical upgrade is obtained at relatively low cost. For sample surface defe
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN117889742A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN117889742A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN117889742A3</originalsourceid><addsrcrecordid>eNrjZIgKSS0uUSjITE1OVUjMS1FISS3LhDJzU0sy8lMU0vKLFApSi4BUbmZeukJ-QUlmcmIOUDaxuLQoNTc1r0QhqVIhsaAgpxIkXwI3j4eBNS0xpziVF0pzMyi6uYY4e-imFuTHpxYXJCan5qWWxDv7GRqaW1hYmpsYORoTowYACoE7Ew</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Test piece and device and method for performing optical measurement by applying test piece</title><source>esp@cenet</source><creator>HUANG CHONGJI ; PAN WENQIANG ; ZHAO WEIWEI</creator><creatorcontrib>HUANG CHONGJI ; PAN WENQIANG ; ZHAO WEIWEI</creatorcontrib><description>According to the test piece and the device and method for optical measurement by using the test piece provided by the invention, the problem of light beam parameter test under the condition of limited space is solved, the test piece can be used under the two conditions of light transmission and light non-transmission, the precision of light spot measurement is further improved, and the measurement accuracy is improved. The minimum light spot size of the converged light beam can be accurately obtained, particularly, parameters such as the three-dimensional size and the Rayleigh range of the light beam to be measured can be obtained at the same time, and therefore the quality of the light beam can be judged. Besides, compared with the prior art, the cost of the technical scheme provided by the invention is extremely low, and the technical scheme provided by the invention is easily realized by modifying the existing device, so that the technical upgrade is obtained at relatively low cost. For sample surface defe</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240416&amp;DB=EPODOC&amp;CC=CN&amp;NR=117889742A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25566,76549</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240416&amp;DB=EPODOC&amp;CC=CN&amp;NR=117889742A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HUANG CHONGJI</creatorcontrib><creatorcontrib>PAN WENQIANG</creatorcontrib><creatorcontrib>ZHAO WEIWEI</creatorcontrib><title>Test piece and device and method for performing optical measurement by applying test piece</title><description>According to the test piece and the device and method for optical measurement by using the test piece provided by the invention, the problem of light beam parameter test under the condition of limited space is solved, the test piece can be used under the two conditions of light transmission and light non-transmission, the precision of light spot measurement is further improved, and the measurement accuracy is improved. The minimum light spot size of the converged light beam can be accurately obtained, particularly, parameters such as the three-dimensional size and the Rayleigh range of the light beam to be measured can be obtained at the same time, and therefore the quality of the light beam can be judged. Besides, compared with the prior art, the cost of the technical scheme provided by the invention is extremely low, and the technical scheme provided by the invention is easily realized by modifying the existing device, so that the technical upgrade is obtained at relatively low cost. For sample surface defe</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZIgKSS0uUSjITE1OVUjMS1FISS3LhDJzU0sy8lMU0vKLFApSi4BUbmZeukJ-QUlmcmIOUDaxuLQoNTc1r0QhqVIhsaAgpxIkXwI3j4eBNS0xpziVF0pzMyi6uYY4e-imFuTHpxYXJCan5qWWxDv7GRqaW1hYmpsYORoTowYACoE7Ew</recordid><startdate>20240416</startdate><enddate>20240416</enddate><creator>HUANG CHONGJI</creator><creator>PAN WENQIANG</creator><creator>ZHAO WEIWEI</creator><scope>EVB</scope></search><sort><creationdate>20240416</creationdate><title>Test piece and device and method for performing optical measurement by applying test piece</title><author>HUANG CHONGJI ; PAN WENQIANG ; ZHAO WEIWEI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN117889742A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HUANG CHONGJI</creatorcontrib><creatorcontrib>PAN WENQIANG</creatorcontrib><creatorcontrib>ZHAO WEIWEI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HUANG CHONGJI</au><au>PAN WENQIANG</au><au>ZHAO WEIWEI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Test piece and device and method for performing optical measurement by applying test piece</title><date>2024-04-16</date><risdate>2024</risdate><abstract>According to the test piece and the device and method for optical measurement by using the test piece provided by the invention, the problem of light beam parameter test under the condition of limited space is solved, the test piece can be used under the two conditions of light transmission and light non-transmission, the precision of light spot measurement is further improved, and the measurement accuracy is improved. The minimum light spot size of the converged light beam can be accurately obtained, particularly, parameters such as the three-dimensional size and the Rayleigh range of the light beam to be measured can be obtained at the same time, and therefore the quality of the light beam can be judged. Besides, compared with the prior art, the cost of the technical scheme provided by the invention is extremely low, and the technical scheme provided by the invention is easily realized by modifying the existing device, so that the technical upgrade is obtained at relatively low cost. For sample surface defe</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title Test piece and device and method for performing optical measurement by applying test piece
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-18T12%3A19%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HUANG%20CHONGJI&rft.date=2024-04-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN117889742A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true