Chip position deviation detection device and sorting machine

The invention relates to a chip position deviation detection device and a sorting machine. The chip position offset detection device comprises a first detection mechanism, a second detection mechanism, a transfer mechanism and a reflection mechanism. The first detection mechanism comprises a first p...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MENG QINGHENG, LIU JIYING
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PERFORMING OPERATIONS PHYSICS POSTAL SORTING SEPARATING SOLIDS FROM SOLIDS SORTING SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING TESTING TRANSPORTING
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