Solid direct injection atomic absorption spectrum device and analysis method
The invention provides a solid direct injection atomic absorption spectrum device and an analysis method.The device comprises a plasma resonant cavity, a plasma excitation source, a quartz tube, an objective table, a sharp line light source and an optical fiber probe, the quartz tube vertically pene...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | LIU ZHUO LIAO HONGHUA QIU DA TIAN CONGKUI TAN JIANFENG LYU JUN |
description | The invention provides a solid direct injection atomic absorption spectrum device and an analysis method.The device comprises a plasma resonant cavity, a plasma excitation source, a quartz tube, an objective table, a sharp line light source and an optical fiber probe, the quartz tube vertically penetrates through the plasma resonant cavity, the objective table is arranged below the lower end of the quartz tube, and the optical fiber probe is arranged below the objective table; discharge gas can enter from the upper end of the quartz tube and generate plasma jet under the action of the plasma excitation source, the plasma jet vertically ablates the solid sample to atomize analysis elements in the solid sample to generate ground state atoms, and the ground state atoms absorb characteristic spectrums in light emitted by the sharp line light source; and the absorbed and weakened light is detected by the optical fiber probe. The device has the beneficial effects that direct detection and analysis of a solid sample |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN117871440A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN117871440A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN117871440A3</originalsourceid><addsrcrecordid>eNrjZPAJzs_JTFFIySxKTS5RyMzLAlKZ-XkKiSX5uZnJColJxflFBWCR4gKgVFFprkJKallmcqpCYl4KECfmVBZnFivkppZk5KfwMLCmJeYUp_JCaW4GRTfXEGcP3dSC_PjU4oLE5NS81JJ4Zz9DQ3MLc0MTEwNHY2LUAADVJjZH</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Solid direct injection atomic absorption spectrum device and analysis method</title><source>esp@cenet</source><creator>LIU ZHUO ; LIAO HONGHUA ; QIU DA ; TIAN CONGKUI ; TAN JIANFENG ; LYU JUN</creator><creatorcontrib>LIU ZHUO ; LIAO HONGHUA ; QIU DA ; TIAN CONGKUI ; TAN JIANFENG ; LYU JUN</creatorcontrib><description>The invention provides a solid direct injection atomic absorption spectrum device and an analysis method.The device comprises a plasma resonant cavity, a plasma excitation source, a quartz tube, an objective table, a sharp line light source and an optical fiber probe, the quartz tube vertically penetrates through the plasma resonant cavity, the objective table is arranged below the lower end of the quartz tube, and the optical fiber probe is arranged below the objective table; discharge gas can enter from the upper end of the quartz tube and generate plasma jet under the action of the plasma excitation source, the plasma jet vertically ablates the solid sample to atomize analysis elements in the solid sample to generate ground state atoms, and the ground state atoms absorb characteristic spectrums in light emitted by the sharp line light source; and the absorbed and weakened light is detected by the optical fiber probe. The device has the beneficial effects that direct detection and analysis of a solid sample</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240412&DB=EPODOC&CC=CN&NR=117871440A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240412&DB=EPODOC&CC=CN&NR=117871440A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LIU ZHUO</creatorcontrib><creatorcontrib>LIAO HONGHUA</creatorcontrib><creatorcontrib>QIU DA</creatorcontrib><creatorcontrib>TIAN CONGKUI</creatorcontrib><creatorcontrib>TAN JIANFENG</creatorcontrib><creatorcontrib>LYU JUN</creatorcontrib><title>Solid direct injection atomic absorption spectrum device and analysis method</title><description>The invention provides a solid direct injection atomic absorption spectrum device and an analysis method.The device comprises a plasma resonant cavity, a plasma excitation source, a quartz tube, an objective table, a sharp line light source and an optical fiber probe, the quartz tube vertically penetrates through the plasma resonant cavity, the objective table is arranged below the lower end of the quartz tube, and the optical fiber probe is arranged below the objective table; discharge gas can enter from the upper end of the quartz tube and generate plasma jet under the action of the plasma excitation source, the plasma jet vertically ablates the solid sample to atomize analysis elements in the solid sample to generate ground state atoms, and the ground state atoms absorb characteristic spectrums in light emitted by the sharp line light source; and the absorbed and weakened light is detected by the optical fiber probe. The device has the beneficial effects that direct detection and analysis of a solid sample</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPAJzs_JTFFIySxKTS5RyMzLAlKZ-XkKiSX5uZnJColJxflFBWCR4gKgVFFprkJKallmcqpCYl4KECfmVBZnFivkppZk5KfwMLCmJeYUp_JCaW4GRTfXEGcP3dSC_PjU4oLE5NS81JJ4Zz9DQ3MLc0MTEwNHY2LUAADVJjZH</recordid><startdate>20240412</startdate><enddate>20240412</enddate><creator>LIU ZHUO</creator><creator>LIAO HONGHUA</creator><creator>QIU DA</creator><creator>TIAN CONGKUI</creator><creator>TAN JIANFENG</creator><creator>LYU JUN</creator><scope>EVB</scope></search><sort><creationdate>20240412</creationdate><title>Solid direct injection atomic absorption spectrum device and analysis method</title><author>LIU ZHUO ; LIAO HONGHUA ; QIU DA ; TIAN CONGKUI ; TAN JIANFENG ; LYU JUN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN117871440A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LIU ZHUO</creatorcontrib><creatorcontrib>LIAO HONGHUA</creatorcontrib><creatorcontrib>QIU DA</creatorcontrib><creatorcontrib>TIAN CONGKUI</creatorcontrib><creatorcontrib>TAN JIANFENG</creatorcontrib><creatorcontrib>LYU JUN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LIU ZHUO</au><au>LIAO HONGHUA</au><au>QIU DA</au><au>TIAN CONGKUI</au><au>TAN JIANFENG</au><au>LYU JUN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Solid direct injection atomic absorption spectrum device and analysis method</title><date>2024-04-12</date><risdate>2024</risdate><abstract>The invention provides a solid direct injection atomic absorption spectrum device and an analysis method.The device comprises a plasma resonant cavity, a plasma excitation source, a quartz tube, an objective table, a sharp line light source and an optical fiber probe, the quartz tube vertically penetrates through the plasma resonant cavity, the objective table is arranged below the lower end of the quartz tube, and the optical fiber probe is arranged below the objective table; discharge gas can enter from the upper end of the quartz tube and generate plasma jet under the action of the plasma excitation source, the plasma jet vertically ablates the solid sample to atomize analysis elements in the solid sample to generate ground state atoms, and the ground state atoms absorb characteristic spectrums in light emitted by the sharp line light source; and the absorbed and weakened light is detected by the optical fiber probe. The device has the beneficial effects that direct detection and analysis of a solid sample</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN117871440A |
source | esp@cenet |
subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | Solid direct injection atomic absorption spectrum device and analysis method |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T19%3A26%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LIU%20ZHUO&rft.date=2024-04-12&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN117871440A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |