Cable conductor insulating layer thickness measuring device and method based on image segmentation

The invention relates to a cable conductor insulation layer thickness measuring device and method based on image segmentation, and the device comprises a camera processing module and a cable installation module, the cable installation module is provided with a cable installation support, and the cab...

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Hauptverfasser: LI JIAHUAN, CHEN JIAWEI, SUN JIEYUN, ZHOU JIE, YE TING, ZHANG TIANYI, CAI CHUNYU, YANG YONGCHENG, CHEN WEIMENG, SONG BINGCHEN, WANG, DONGYUE, LING LIYONG, WANG ZHENXING
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creator LI JIAHUAN
CHEN JIAWEI
SUN JIEYUN
ZHOU JIE
YE TING
ZHANG TIANYI
CAI CHUNYU
YANG YONGCHENG
CHEN WEIMENG
SONG BINGCHEN
WANG, DONGYUE
LING LIYONG
WANG ZHENXING
description The invention relates to a cable conductor insulation layer thickness measuring device and method based on image segmentation, and the device comprises a camera processing module and a cable installation module, the cable installation module is provided with a cable installation support, and the cable installation support is installed on an electric translation sliding table and an electric lifting table and can drive a cable to move. Images of different areas of the end face of the cable are shot through the camera processing module, and the method comprises the steps of using an artificial intelligence algorithm to automatically select demarcation points between layers of the cable, and performing automatic measurement and calculation to obtain the average value, the minimum value, the maximum value and the eccentricity rate of the thickness of each layer. Compared with the prior art, the device has the advantages of rapid detection, lightness, portability, simplicity in operation and the like. 本发明涉及一种基于图像分
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN117870555A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN117870555A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN117870555A3</originalsourceid><addsrcrecordid>eNqNjEEKwjAQRbtxIeodxgMIFil1K0Vx5cp9mSbfNphMSicRvL0VPICrD-89_rLoGu48yESx2aQ4kRPNnpOTnjy_MVEanHkKVCmANU9fY_FyBsRiZ5iGaKljhaUo5AL3IEUfIGn-ibIuFg_2is1vV8X2cr431x3G2EJHNhCktrmVZX2s91VVnQ7_NB-NtD6C</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Cable conductor insulating layer thickness measuring device and method based on image segmentation</title><source>esp@cenet</source><creator>LI JIAHUAN ; CHEN JIAWEI ; SUN JIEYUN ; ZHOU JIE ; YE TING ; ZHANG TIANYI ; CAI CHUNYU ; YANG YONGCHENG ; CHEN WEIMENG ; SONG BINGCHEN ; WANG, DONGYUE ; LING LIYONG ; WANG ZHENXING</creator><creatorcontrib>LI JIAHUAN ; CHEN JIAWEI ; SUN JIEYUN ; ZHOU JIE ; YE TING ; ZHANG TIANYI ; CAI CHUNYU ; YANG YONGCHENG ; CHEN WEIMENG ; SONG BINGCHEN ; WANG, DONGYUE ; LING LIYONG ; WANG ZHENXING</creatorcontrib><description>The invention relates to a cable conductor insulation layer thickness measuring device and method based on image segmentation, and the device comprises a camera processing module and a cable installation module, the cable installation module is provided with a cable installation support, and the cable installation support is installed on an electric translation sliding table and an electric lifting table and can drive a cable to move. Images of different areas of the end face of the cable are shot through the camera processing module, and the method comprises the steps of using an artificial intelligence algorithm to automatically select demarcation points between layers of the cable, and performing automatic measurement and calculation to obtain the average value, the minimum value, the maximum value and the eccentricity rate of the thickness of each layer. Compared with the prior art, the device has the advantages of rapid detection, lightness, portability, simplicity in operation and the like. 本发明涉及一种基于图像分</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240412&amp;DB=EPODOC&amp;CC=CN&amp;NR=117870555A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25544,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240412&amp;DB=EPODOC&amp;CC=CN&amp;NR=117870555A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LI JIAHUAN</creatorcontrib><creatorcontrib>CHEN JIAWEI</creatorcontrib><creatorcontrib>SUN JIEYUN</creatorcontrib><creatorcontrib>ZHOU JIE</creatorcontrib><creatorcontrib>YE TING</creatorcontrib><creatorcontrib>ZHANG TIANYI</creatorcontrib><creatorcontrib>CAI CHUNYU</creatorcontrib><creatorcontrib>YANG YONGCHENG</creatorcontrib><creatorcontrib>CHEN WEIMENG</creatorcontrib><creatorcontrib>SONG BINGCHEN</creatorcontrib><creatorcontrib>WANG, DONGYUE</creatorcontrib><creatorcontrib>LING LIYONG</creatorcontrib><creatorcontrib>WANG ZHENXING</creatorcontrib><title>Cable conductor insulating layer thickness measuring device and method based on image segmentation</title><description>The invention relates to a cable conductor insulation layer thickness measuring device and method based on image segmentation, and the device comprises a camera processing module and a cable installation module, the cable installation module is provided with a cable installation support, and the cable installation support is installed on an electric translation sliding table and an electric lifting table and can drive a cable to move. Images of different areas of the end face of the cable are shot through the camera processing module, and the method comprises the steps of using an artificial intelligence algorithm to automatically select demarcation points between layers of the cable, and performing automatic measurement and calculation to obtain the average value, the minimum value, the maximum value and the eccentricity rate of the thickness of each layer. Compared with the prior art, the device has the advantages of rapid detection, lightness, portability, simplicity in operation and the like. 本发明涉及一种基于图像分</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjEEKwjAQRbtxIeodxgMIFil1K0Vx5cp9mSbfNphMSicRvL0VPICrD-89_rLoGu48yESx2aQ4kRPNnpOTnjy_MVEanHkKVCmANU9fY_FyBsRiZ5iGaKljhaUo5AL3IEUfIGn-ibIuFg_2is1vV8X2cr431x3G2EJHNhCktrmVZX2s91VVnQ7_NB-NtD6C</recordid><startdate>20240412</startdate><enddate>20240412</enddate><creator>LI JIAHUAN</creator><creator>CHEN JIAWEI</creator><creator>SUN JIEYUN</creator><creator>ZHOU JIE</creator><creator>YE TING</creator><creator>ZHANG TIANYI</creator><creator>CAI CHUNYU</creator><creator>YANG YONGCHENG</creator><creator>CHEN WEIMENG</creator><creator>SONG BINGCHEN</creator><creator>WANG, DONGYUE</creator><creator>LING LIYONG</creator><creator>WANG ZHENXING</creator><scope>EVB</scope></search><sort><creationdate>20240412</creationdate><title>Cable conductor insulating layer thickness measuring device and method based on image segmentation</title><author>LI JIAHUAN ; CHEN JIAWEI ; SUN JIEYUN ; ZHOU JIE ; YE TING ; ZHANG TIANYI ; CAI CHUNYU ; YANG YONGCHENG ; CHEN WEIMENG ; SONG BINGCHEN ; WANG, DONGYUE ; LING LIYONG ; WANG ZHENXING</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN117870555A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LI JIAHUAN</creatorcontrib><creatorcontrib>CHEN JIAWEI</creatorcontrib><creatorcontrib>SUN JIEYUN</creatorcontrib><creatorcontrib>ZHOU JIE</creatorcontrib><creatorcontrib>YE TING</creatorcontrib><creatorcontrib>ZHANG TIANYI</creatorcontrib><creatorcontrib>CAI CHUNYU</creatorcontrib><creatorcontrib>YANG YONGCHENG</creatorcontrib><creatorcontrib>CHEN WEIMENG</creatorcontrib><creatorcontrib>SONG BINGCHEN</creatorcontrib><creatorcontrib>WANG, DONGYUE</creatorcontrib><creatorcontrib>LING LIYONG</creatorcontrib><creatorcontrib>WANG ZHENXING</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LI JIAHUAN</au><au>CHEN JIAWEI</au><au>SUN JIEYUN</au><au>ZHOU JIE</au><au>YE TING</au><au>ZHANG TIANYI</au><au>CAI CHUNYU</au><au>YANG YONGCHENG</au><au>CHEN WEIMENG</au><au>SONG BINGCHEN</au><au>WANG, DONGYUE</au><au>LING LIYONG</au><au>WANG ZHENXING</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Cable conductor insulating layer thickness measuring device and method based on image segmentation</title><date>2024-04-12</date><risdate>2024</risdate><abstract>The invention relates to a cable conductor insulation layer thickness measuring device and method based on image segmentation, and the device comprises a camera processing module and a cable installation module, the cable installation module is provided with a cable installation support, and the cable installation support is installed on an electric translation sliding table and an electric lifting table and can drive a cable to move. Images of different areas of the end face of the cable are shot through the camera processing module, and the method comprises the steps of using an artificial intelligence algorithm to automatically select demarcation points between layers of the cable, and performing automatic measurement and calculation to obtain the average value, the minimum value, the maximum value and the eccentricity rate of the thickness of each layer. Compared with the prior art, the device has the advantages of rapid detection, lightness, portability, simplicity in operation and the like. 本发明涉及一种基于图像分</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title Cable conductor insulating layer thickness measuring device and method based on image segmentation
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T12%3A53%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LI%20JIAHUAN&rft.date=2024-04-12&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN117870555A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true