Sample testing system, sample testing program, and sample testing method
The invention relates to a sample testing system, a sample testing program, and a sample testing method. According to the present invention, a test can be performed over a long period of time by automatically performing a charging process of an electric vehicle or a part thereof, and a test object c...
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| creator | KIKUTA TAKAYUKI SHIOMI KENJI FURUKAWA KAZUKI |
| description | The invention relates to a sample testing system, a sample testing program, and a sample testing method. According to the present invention, a test can be performed over a long period of time by automatically performing a charging process of an electric vehicle or a part thereof, and a test object can be tested under conditions that reproduce actual road travel. A test specimen testing system (100) for testing a test specimen (W) by charging the test specimen (W), which is an electric vehicle or part of the electric vehicle, with a power supply device (3), the test specimen testing system (100) comprising: a dynamometer (2) for applying a load to the test specimen (W); an information acquisition unit (6) that acquires information about the specimen (W); and a test control unit (7) that controls the test of the specimen (W) on the basis of the information of the specimen (W), the test control unit (7) stopping the operation of the specimen (W) and charging the specimen (W) by the power supply device (3) when t |
| format | Patent |
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According to the present invention, a test can be performed over a long period of time by automatically performing a charging process of an electric vehicle or a part thereof, and a test object can be tested under conditions that reproduce actual road travel. A test specimen testing system (100) for testing a test specimen (W) by charging the test specimen (W), which is an electric vehicle or part of the electric vehicle, with a power supply device (3), the test specimen testing system (100) comprising: a dynamometer (2) for applying a load to the test specimen (W); an information acquisition unit (6) that acquires information about the specimen (W); and a test control unit (7) that controls the test of the specimen (W) on the basis of the information of the specimen (W), the test control unit (7) stopping the operation of the specimen (W) and charging the specimen (W) by the power supply device (3) when t</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240405&DB=EPODOC&CC=CN&NR=117836643A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240405&DB=EPODOC&CC=CN&NR=117836643A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KIKUTA TAKAYUKI</creatorcontrib><creatorcontrib>SHIOMI KENJI</creatorcontrib><creatorcontrib>FURUKAWA KAZUKI</creatorcontrib><title>Sample testing system, sample testing program, and sample testing method</title><description>The invention relates to a sample testing system, a sample testing program, and a sample testing method. 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| language | chi ; eng |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
| title | Sample testing system, sample testing program, and sample testing method |
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