Quality inspection index maintenance method and device, computing equipment and storage medium
Embodiments of the invention provide a quality inspection index maintenance method and apparatus, a computing device and a storage medium. The quality inspection index maintenance method comprises the steps of receiving an index maintenance request initiated for a to-be-maintained index; historical...
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| creator | LIU KUN LYU BIN WANG BIANHONG ZHAO XINBEI |
| description | Embodiments of the invention provide a quality inspection index maintenance method and apparatus, a computing device and a storage medium. The quality inspection index maintenance method comprises the steps of receiving an index maintenance request initiated for a to-be-maintained index; historical quality inspection data corresponding to the to-be-maintained index and a target deviation value corresponding to the to-be-maintained index are obtained, and the target deviation value is set based on quality inspection qualification logic under the to-be-maintained index; and determining an update index according to the historical quality inspection data and the target deviation value, and updating an index to be maintained in a quality inspection model based on the update index. The updating index is determined through the historical quality inspection data and the target deviation value, the excessive deviation between the updating index and the actual index can be prevented, the index is updated in time, the a |
| format | Patent |
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| subjects | CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR |
| title | Quality inspection index maintenance method and device, computing equipment and storage medium |
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