Measuring method and measuring device

A measurement method, comprising: acquiring a first image and a second image of a target object, where the first image is acquired by a camera located on a non-backlight side of the target object and the second image is acquired by a camera located on a backlight side of the target object (110); and...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SHU ANNAN, JIANG GUANNAN, ZHUANG WEILIN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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