Domestic NPN bipolar transistor automatic test method and test device thereof

The invention discloses a domestic NPN bipolar transistor automatic test method and a test device thereof. The test device is specifically divided into a direct current parameter test circuit and a dynamic performance test circuit. The direct current parameter index test circuit is used for testing a base-emitter saturation voltage VBE, a collector-emitter saturation voltage VCE and direct current characteristic parameters of a direct current amplification factor hFE transistor in an open state; the dynamic performance test circuit comprises five types of typical application circuits built around the tested transistor and is used for amplifying dynamic performance parameters such as circuit application frequency characteristic verification, switching circuit application starting time verification and switching circuit application turn-off time verification; the external instrument provides test excitation signals and test waveform and data acquisition, the verification mother board is responsible for accessin