FLRD-based dual-path multiplexing type current sensor

The invention provides a FLRD-based dual-path multiplexing type current sensor, which belongs to the technical field of current sensors and comprises a light source module, an optical isolator, a first coupler, a delay line, a third coupler, a fourth coupler, a second coupler, a photoelectric detect...

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Hauptverfasser: ZOU HONGSEN, CHEN YUZHUO, CHAI BIN, WEI PENG, MAO CHUNXIANG, ZHANG LIMING, WU JIAWEI, GENG XIANGRUI, XU HUI, LIU RUOPENG, LI YANG, LIU SHUYANG, PAN LIANGLIANG
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creator ZOU HONGSEN
CHEN YUZHUO
CHAI BIN
WEI PENG
MAO CHUNXIANG
ZHANG LIMING
WU JIAWEI
GENG XIANGRUI
XU HUI
LIU RUOPENG
LI YANG
LIU SHUYANG
PAN LIANGLIANG
description The invention provides a FLRD-based dual-path multiplexing type current sensor, which belongs to the technical field of current sensors and comprises a light source module, an optical isolator, a first coupler, a delay line, a third coupler, a fourth coupler, a second coupler, a photoelectric detector and a phase detector which are connected in sequence, the low-coupling-ratio two ends of the first coupler and the second coupler are interconnected, the high-coupling-ratio two ends of the first coupler and the second coupler are connected to form a first optical fiber loop, the low-coupling-ratio two ends of the third coupler and the fourth coupler are interconnected, and the high-coupling-ratio two ends of the third coupler and the fourth coupler are connected to form a second optical fiber loop; wherein the optical isolator is interconnected with the high-coupling-ratio end of the first coupler, the delay line is interconnected with the high-coupling-ratio end of the third coupler, the high-coupling-ratio en
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN117761379A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN117761379A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN117761379A3</originalsourceid><addsrcrecordid>eNrjZDB18wly0U1KLE5NUUgpTczRLUgsyVDILc0pySzISa3IzEtXKKksSFVILi0qSs0rUShOzSvOL-JhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaG5uZmhsbmlo7GxKgBAEmGLSU</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>FLRD-based dual-path multiplexing type current sensor</title><source>esp@cenet</source><creator>ZOU HONGSEN ; CHEN YUZHUO ; CHAI BIN ; WEI PENG ; MAO CHUNXIANG ; ZHANG LIMING ; WU JIAWEI ; GENG XIANGRUI ; XU HUI ; LIU RUOPENG ; LI YANG ; LIU SHUYANG ; PAN LIANGLIANG</creator><creatorcontrib>ZOU HONGSEN ; CHEN YUZHUO ; CHAI BIN ; WEI PENG ; MAO CHUNXIANG ; ZHANG LIMING ; WU JIAWEI ; GENG XIANGRUI ; XU HUI ; LIU RUOPENG ; LI YANG ; LIU SHUYANG ; PAN LIANGLIANG</creatorcontrib><description>The invention provides a FLRD-based dual-path multiplexing type current sensor, which belongs to the technical field of current sensors and comprises a light source module, an optical isolator, a first coupler, a delay line, a third coupler, a fourth coupler, a second coupler, a photoelectric detector and a phase detector which are connected in sequence, the low-coupling-ratio two ends of the first coupler and the second coupler are interconnected, the high-coupling-ratio two ends of the first coupler and the second coupler are connected to form a first optical fiber loop, the low-coupling-ratio two ends of the third coupler and the fourth coupler are interconnected, and the high-coupling-ratio two ends of the third coupler and the fourth coupler are connected to form a second optical fiber loop; wherein the optical isolator is interconnected with the high-coupling-ratio end of the first coupler, the delay line is interconnected with the high-coupling-ratio end of the third coupler, the high-coupling-ratio en</description><language>chi ; eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; DRESSING OR CONDITIONING OF ABRADING SURFACES ; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS ; GRINDING ; MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PERFORMING OPERATIONS ; PHYSICS ; POLISHING ; TARIFF METERING APPARATUS ; TESTING ; TRANSPORTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240326&amp;DB=EPODOC&amp;CC=CN&amp;NR=117761379A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240326&amp;DB=EPODOC&amp;CC=CN&amp;NR=117761379A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZOU HONGSEN</creatorcontrib><creatorcontrib>CHEN YUZHUO</creatorcontrib><creatorcontrib>CHAI BIN</creatorcontrib><creatorcontrib>WEI PENG</creatorcontrib><creatorcontrib>MAO CHUNXIANG</creatorcontrib><creatorcontrib>ZHANG LIMING</creatorcontrib><creatorcontrib>WU JIAWEI</creatorcontrib><creatorcontrib>GENG XIANGRUI</creatorcontrib><creatorcontrib>XU HUI</creatorcontrib><creatorcontrib>LIU RUOPENG</creatorcontrib><creatorcontrib>LI YANG</creatorcontrib><creatorcontrib>LIU SHUYANG</creatorcontrib><creatorcontrib>PAN LIANGLIANG</creatorcontrib><title>FLRD-based dual-path multiplexing type current sensor</title><description>The invention provides a FLRD-based dual-path multiplexing type current sensor, which belongs to the technical field of current sensors and comprises a light source module, an optical isolator, a first coupler, a delay line, a third coupler, a fourth coupler, a second coupler, a photoelectric detector and a phase detector which are connected in sequence, the low-coupling-ratio two ends of the first coupler and the second coupler are interconnected, the high-coupling-ratio two ends of the first coupler and the second coupler are connected to form a first optical fiber loop, the low-coupling-ratio two ends of the third coupler and the fourth coupler are interconnected, and the high-coupling-ratio two ends of the third coupler and the fourth coupler are connected to form a second optical fiber loop; wherein the optical isolator is interconnected with the high-coupling-ratio end of the first coupler, the delay line is interconnected with the high-coupling-ratio end of the third coupler, the high-coupling-ratio en</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>DRESSING OR CONDITIONING OF ABRADING SURFACES</subject><subject>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</subject><subject>GRINDING</subject><subject>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>POLISHING</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB18wly0U1KLE5NUUgpTczRLUgsyVDILc0pySzISa3IzEtXKKksSFVILi0qSs0rUShOzSvOL-JhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaG5uZmhsbmlo7GxKgBAEmGLSU</recordid><startdate>20240326</startdate><enddate>20240326</enddate><creator>ZOU HONGSEN</creator><creator>CHEN YUZHUO</creator><creator>CHAI BIN</creator><creator>WEI PENG</creator><creator>MAO CHUNXIANG</creator><creator>ZHANG LIMING</creator><creator>WU JIAWEI</creator><creator>GENG XIANGRUI</creator><creator>XU HUI</creator><creator>LIU RUOPENG</creator><creator>LI YANG</creator><creator>LIU SHUYANG</creator><creator>PAN LIANGLIANG</creator><scope>EVB</scope></search><sort><creationdate>20240326</creationdate><title>FLRD-based dual-path multiplexing type current sensor</title><author>ZOU HONGSEN ; CHEN YUZHUO ; CHAI BIN ; WEI PENG ; MAO CHUNXIANG ; ZHANG LIMING ; WU JIAWEI ; GENG XIANGRUI ; XU HUI ; LIU RUOPENG ; LI YANG ; LIU SHUYANG ; PAN LIANGLIANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN117761379A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>DRESSING OR CONDITIONING OF ABRADING SURFACES</topic><topic>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</topic><topic>GRINDING</topic><topic>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>POLISHING</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZOU HONGSEN</creatorcontrib><creatorcontrib>CHEN YUZHUO</creatorcontrib><creatorcontrib>CHAI BIN</creatorcontrib><creatorcontrib>WEI PENG</creatorcontrib><creatorcontrib>MAO CHUNXIANG</creatorcontrib><creatorcontrib>ZHANG LIMING</creatorcontrib><creatorcontrib>WU JIAWEI</creatorcontrib><creatorcontrib>GENG XIANGRUI</creatorcontrib><creatorcontrib>XU HUI</creatorcontrib><creatorcontrib>LIU RUOPENG</creatorcontrib><creatorcontrib>LI YANG</creatorcontrib><creatorcontrib>LIU SHUYANG</creatorcontrib><creatorcontrib>PAN LIANGLIANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZOU HONGSEN</au><au>CHEN YUZHUO</au><au>CHAI BIN</au><au>WEI PENG</au><au>MAO CHUNXIANG</au><au>ZHANG LIMING</au><au>WU JIAWEI</au><au>GENG XIANGRUI</au><au>XU HUI</au><au>LIU RUOPENG</au><au>LI YANG</au><au>LIU SHUYANG</au><au>PAN LIANGLIANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>FLRD-based dual-path multiplexing type current sensor</title><date>2024-03-26</date><risdate>2024</risdate><abstract>The invention provides a FLRD-based dual-path multiplexing type current sensor, which belongs to the technical field of current sensors and comprises a light source module, an optical isolator, a first coupler, a delay line, a third coupler, a fourth coupler, a second coupler, a photoelectric detector and a phase detector which are connected in sequence, the low-coupling-ratio two ends of the first coupler and the second coupler are interconnected, the high-coupling-ratio two ends of the first coupler and the second coupler are connected to form a first optical fiber loop, the low-coupling-ratio two ends of the third coupler and the fourth coupler are interconnected, and the high-coupling-ratio two ends of the third coupler and the fourth coupler are connected to form a second optical fiber loop; wherein the optical isolator is interconnected with the high-coupling-ratio end of the first coupler, the delay line is interconnected with the high-coupling-ratio end of the third coupler, the high-coupling-ratio en</abstract><oa>free_for_read</oa></addata></record>
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subjects ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
DRESSING OR CONDITIONING OF ABRADING SURFACES
FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
GRINDING
MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PERFORMING OPERATIONS
PHYSICS
POLISHING
TARIFF METERING APPARATUS
TESTING
TRANSPORTING
title FLRD-based dual-path multiplexing type current sensor
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T18%3A20%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ZOU%20HONGSEN&rft.date=2024-03-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN117761379A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true