Semiconductor laser self-mixing interference dual-channel displacement measuring device and method

The invention discloses a semiconductor laser self-mixing interference dual-channel displacement measurement device which comprises a semiconductor laser, a lens light splitting unit, a first target reflector, a second target reflector, a signal processing circuit and a data acquisition and processi...

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Hauptverfasser: LIAN TIANHONG, WANG CUO, KOU KE, FAN YUZHEN
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Sprache:chi ; eng
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creator LIAN TIANHONG
WANG CUO
KOU KE
FAN YUZHEN
description The invention discloses a semiconductor laser self-mixing interference dual-channel displacement measurement device which comprises a semiconductor laser, a lens light splitting unit, a first target reflector, a second target reflector, a signal processing circuit and a data acquisition and processing unit. The device further comprises a temperature controller, a driver and a signal generator. The temperature controller and the driver are connected with the semiconductor laser; the driver is also connected with the signal generator; and the semiconductor laser and the data acquisition and processing unit are connected with the signal processing circuit. The device solves the problems that the existing domestic dual-channel measurement structure is complex and can only be applied to the occasion where the motion frequencies of two target objects differ greatly, the detection efficiency is improved, and repeated secondary measurement is avoided. The invention also discloses a semiconductor laser self-mixing int
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language chi ; eng
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title Semiconductor laser self-mixing interference dual-channel displacement measuring device and method
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