Equipment testing method and related device

The invention provides an equipment testing method and related device.Firstly, if it is detected that tested equipment in a microwave darkroom has a first anomaly in a preset testing process, first audio data are determined according to the first anomaly, and the first audio data are used for enabling the tested equipment to execute a first instruction to repair the first anomaly; then, outputting the first audio data to the tested equipment; and finally, if it is detected that the tested device presents a first display effect after receiving the first audio data, it is determined that the tested device completes the first instruction, and the tested device continues to execute the preset test process to obtain test data. Abnormality in the testing process can be automatically detected, the tested equipment can be automatically adjusted, manual adjustment is not needed, the labor cost is greatly saved, and meanwhile the testing efficiency is improved. 本申请提供了一种设备测试方法及相关装置，首先，若检测到微波暗室内的被测试设备在预设测试流程出现第一异常，根据所述第一