Automatic lighting optimization equipment and method

The invention belongs to the technical field of automatic detection, and particularly relates to automatic lighting optimization equipment and method.Multiple sets of object lighting images are obtained through an industrial camera, an object carrying platform and multiple light sources, and the obj...

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description The invention belongs to the technical field of automatic detection, and particularly relates to automatic lighting optimization equipment and method.Multiple sets of object lighting images are obtained through an industrial camera, an object carrying platform and multiple light sources, and the object lighting images pass through a positioning module, a size measurement module, a code reading module and a defect detection module of an image processing unit according to specific tasks specified by clients; the lighting effect is optimized by automatically adjusting the camera module, the light source module and the platform module, the lighting effect is comprehensively evaluated based on an intelligent algorithm, an optimal lighting scheme is obtained according to comprehensive evaluation, and a final scheme is output for a user to use in a specific visual task. 本发明属于自动化检测技术领域,尤其涉及一种自动打光优化设备及方法,通过工业相机、载物平台与多个光源,获取多组物体打光图像,其经过图像处理单元的定位模块、尺寸测量模块、读码模块与缺陷检测模块根据客户指定的具体任务,自动调整相机模块、光源模块与平台模块来优化打光效果,基于智能算法综合评估打光效果,根
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN117705717A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN117705717A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN117705717A3</originalsourceid><addsrcrecordid>eNrjZDBxLC3Jz00syUxWyMlMzyjJzEtXyC8oyczNrAIK5ucppBaWZhbkpuaVKCTmpSjkppZk5KfwMLCmJeYUp_JCaW4GRTfXEGcP3dSC_PjU4oLE5NS81JJ4Zz9DQ3NzA1NzQ3NHY2LUAAB-xS1z</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Automatic lighting optimization equipment and method</title><source>esp@cenet</source><creator>ZENG YILONG</creator><creatorcontrib>ZENG YILONG</creatorcontrib><description>The invention belongs to the technical field of automatic detection, and particularly relates to automatic lighting optimization equipment and method.Multiple sets of object lighting images are obtained through an industrial camera, an object carrying platform and multiple light sources, and the object lighting images pass through a positioning module, a size measurement module, a code reading module and a defect detection module of an image processing unit according to specific tasks specified by clients; the lighting effect is optimized by automatically adjusting the camera module, the light source module and the platform module, the lighting effect is comprehensively evaluated based on an intelligent algorithm, an optimal lighting scheme is obtained according to comprehensive evaluation, and a final scheme is output for a user to use in a specific visual task. 本发明属于自动化检测技术领域,尤其涉及一种自动打光优化设备及方法,通过工业相机、载物平台与多个光源,获取多组物体打光图像,其经过图像处理单元的定位模块、尺寸测量模块、读码模块与缺陷检测模块根据客户指定的具体任务,自动调整相机模块、光源模块与平台模块来优化打光效果,基于智能算法综合评估打光效果,根</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; HANDLING RECORD CARRIERS ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; PRESENTATION OF DATA ; RECOGNITION OF DATA ; RECORD CARRIERS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240315&amp;DB=EPODOC&amp;CC=CN&amp;NR=117705717A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240315&amp;DB=EPODOC&amp;CC=CN&amp;NR=117705717A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZENG YILONG</creatorcontrib><title>Automatic lighting optimization equipment and method</title><description>The invention belongs to the technical field of automatic detection, and particularly relates to automatic lighting optimization equipment and method.Multiple sets of object lighting images are obtained through an industrial camera, an object carrying platform and multiple light sources, and the object lighting images pass through a positioning module, a size measurement module, a code reading module and a defect detection module of an image processing unit according to specific tasks specified by clients; the lighting effect is optimized by automatically adjusting the camera module, the light source module and the platform module, the lighting effect is comprehensively evaluated based on an intelligent algorithm, an optimal lighting scheme is obtained according to comprehensive evaluation, and a final scheme is output for a user to use in a specific visual task. 本发明属于自动化检测技术领域,尤其涉及一种自动打光优化设备及方法,通过工业相机、载物平台与多个光源,获取多组物体打光图像,其经过图像处理单元的定位模块、尺寸测量模块、读码模块与缺陷检测模块根据客户指定的具体任务,自动调整相机模块、光源模块与平台模块来优化打光效果,基于智能算法综合评估打光效果,根</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>HANDLING RECORD CARRIERS</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>PRESENTATION OF DATA</subject><subject>RECOGNITION OF DATA</subject><subject>RECORD CARRIERS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDBxLC3Jz00syUxWyMlMzyjJzEtXyC8oyczNrAIK5ucppBaWZhbkpuaVKCTmpSjkppZk5KfwMLCmJeYUp_JCaW4GRTfXEGcP3dSC_PjU4oLE5NS81JJ4Zz9DQ3NzA1NzQ3NHY2LUAAB-xS1z</recordid><startdate>20240315</startdate><enddate>20240315</enddate><creator>ZENG YILONG</creator><scope>EVB</scope></search><sort><creationdate>20240315</creationdate><title>Automatic lighting optimization equipment and method</title><author>ZENG YILONG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN117705717A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>HANDLING RECORD CARRIERS</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>PRESENTATION OF DATA</topic><topic>RECOGNITION OF DATA</topic><topic>RECORD CARRIERS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZENG YILONG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZENG YILONG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Automatic lighting optimization equipment and method</title><date>2024-03-15</date><risdate>2024</risdate><abstract>The invention belongs to the technical field of automatic detection, and particularly relates to automatic lighting optimization equipment and method.Multiple sets of object lighting images are obtained through an industrial camera, an object carrying platform and multiple light sources, and the object lighting images pass through a positioning module, a size measurement module, a code reading module and a defect detection module of an image processing unit according to specific tasks specified by clients; the lighting effect is optimized by automatically adjusting the camera module, the light source module and the platform module, the lighting effect is comprehensively evaluated based on an intelligent algorithm, an optimal lighting scheme is obtained according to comprehensive evaluation, and a final scheme is output for a user to use in a specific visual task. 本发明属于自动化检测技术领域,尤其涉及一种自动打光优化设备及方法,通过工业相机、载物平台与多个光源,获取多组物体打光图像,其经过图像处理单元的定位模块、尺寸测量模块、读码模块与缺陷检测模块根据客户指定的具体任务,自动调整相机模块、光源模块与平台模块来优化打光效果,基于智能算法综合评估打光效果,根</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTING
COUNTING
HANDLING RECORD CARRIERS
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
PRESENTATION OF DATA
RECOGNITION OF DATA
RECORD CARRIERS
TESTING
title Automatic lighting optimization equipment and method
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T10%3A23%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ZENG%20YILONG&rft.date=2024-03-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN117705717A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true