Electronic component detection device
The invention relates to an electronic component detection device. Specifically, according to one embodiment of the present invention, the present invention comprises: a reflected light output unit; a reflection part providing a light movement path from at least a part of the appearance of the elect...
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| creator | NOH JONG-KI NA YUN-SUNG |
| description | The invention relates to an electronic component detection device. Specifically, according to one embodiment of the present invention, the present invention comprises: a reflected light output unit; a reflection part providing a light movement path from at least a part of the appearance of the electronic component to the reflected light output part, and reflecting light incident from at least a part of the appearance of the electronic component; and a rotating portion that rotates the reflecting portion such that the reflecting portion rotates about a predetermined rotation axis.
本发明涉及一种电子部件检测装置。具体地，根据本发明的一个实施例，包括，反射光输出部；反射部，提供从电子部件的外观的至少一部分到所述反射光输出部的光移动路径，并反射从电子部件的外观的至少一部分入射的光；及旋转部，所述旋转部旋转所述反射部，使得所述反射部绕预定的旋转轴线旋转。 |
| format | Patent |
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本发明涉及一种电子部件检测装置。具体地，根据本发明的一个实施例，包括，反射光输出部；反射部，提供从电子部件的外观的至少一部分到所述反射光输出部的光移动路径，并反射从电子部件的外观的至少一部分入射的光；及旋转部，所述旋转部旋转所述反射部，使得所述反射部绕预定的旋转轴线旋转。</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240308&DB=EPODOC&CC=CN&NR=117664976A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25544,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240308&DB=EPODOC&CC=CN&NR=117664976A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NOH JONG-KI</creatorcontrib><creatorcontrib>NA YUN-SUNG</creatorcontrib><title>Electronic component detection device</title><description>The invention relates to an electronic component detection device. Specifically, according to one embodiment of the present invention, the present invention comprises: a reflected light output unit; a reflection part providing a light movement path from at least a part of the appearance of the electronic component to the reflected light output part, and reflecting light incident from at least a part of the appearance of the electronic component; and a rotating portion that rotates the reflecting portion such that the reflecting portion rotates about a predetermined rotation axis.
本发明涉及一种电子部件检测装置。具体地，根据本发明的一个实施例，包括，反射光输出部；反射部，提供从电子部件的外观的至少一部分到所述反射光输出部的光移动路径，并反射从电子部件的外观的至少一部分入射的光；及旋转部，所述旋转部旋转所述反射部，使得所述反射部绕预定的旋转轴线旋转。</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFB1zUlNLinKz8tMVkjOzy3Iz0vNK1FISS0Bimbm5wFZZZnJqTwMrGmJOcWpvFCam0HRzTXE2UM3tSA_PrW4IDE5NS-1JN7Zz9DQ3MzMxNLczNGYGDUAY8cnlA</recordid><startdate>20240308</startdate><enddate>20240308</enddate><creator>NOH JONG-KI</creator><creator>NA YUN-SUNG</creator><scope>EVB</scope></search><sort><creationdate>20240308</creationdate><title>Electronic component detection device</title><author>NOH JONG-KI ; NA YUN-SUNG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN117664976A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NOH JONG-KI</creatorcontrib><creatorcontrib>NA YUN-SUNG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NOH JONG-KI</au><au>NA YUN-SUNG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Electronic component detection device</title><date>2024-03-08</date><risdate>2024</risdate><abstract>The invention relates to an electronic component detection device. Specifically, according to one embodiment of the present invention, the present invention comprises: a reflected light output unit; a reflection part providing a light movement path from at least a part of the appearance of the electronic component to the reflected light output part, and reflecting light incident from at least a part of the appearance of the electronic component; and a rotating portion that rotates the reflecting portion such that the reflecting portion rotates about a predetermined rotation axis.
本发明涉及一种电子部件检测装置。具体地，根据本发明的一个实施例，包括，反射光输出部；反射部，提供从电子部件的外观的至少一部分到所述反射光输出部的光移动路径，并反射从电子部件的外观的至少一部分入射的光；及旋转部，所述旋转部旋转所述反射部，使得所述反射部绕预定的旋转轴线旋转。</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Electronic component detection device |
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