System and method for sampling
The present invention relates to a sampling system (100) in which sampling is based on removal of material from a sample immersed in a fluid by cavitation caused by high intensity focused ultrasound (HIFU). The system further comprises a feeding device (105) for conveying at least a portion of the m...
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| creator | SALMI, ARI KOTIO TAPIO LASSILA PETRI HAEGGSTROM EDWARD KULONEN ANTTI HOLMSTRU M, ASSI SILLANPUU, TOM HYVONEN, JERRY MAKINEN JONI |
| description | The present invention relates to a sampling system (100) in which sampling is based on removal of material from a sample immersed in a fluid by cavitation caused by high intensity focused ultrasound (HIFU). The system further comprises a feeding device (105) for conveying at least a portion of the material removed from the fluid to the detection device (106). The invention also relates to a method of feeding material from a sample to a detection device using the sampling system.
本发明涉及一种取样系统(100)，其中，取样基于通过由高强度聚焦超声(HIFU)引起的空化从沉浸在流体中的样本中移除材料。该系统还包括用于将从流体移除的材料的至少一部分输送到检测装置(106)的馈送装置(105)。本发明还涉及使用取样系统将材料从样本馈送到检测装置的方法。 |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN117652011A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN117652011A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN117652011A3</originalsourceid><addsrcrecordid>eNrjZJALriwuSc1VSMxLUchNLcnIT1FIyy9SKE7MLcjJzEvnYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhuZmpkYGhoaOxsSoAQDqRSRQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>System and method for sampling</title><source>esp@cenet</source><creator>SALMI, ARI ; KOTIO TAPIO ; LASSILA PETRI ; HAEGGSTROM EDWARD ; KULONEN ANTTI ; HOLMSTRU M, ASSI ; SILLANPUU, TOM ; HYVONEN, JERRY ; MAKINEN JONI</creator><creatorcontrib>SALMI, ARI ; KOTIO TAPIO ; LASSILA PETRI ; HAEGGSTROM EDWARD ; KULONEN ANTTI ; HOLMSTRU M, ASSI ; SILLANPUU, TOM ; HYVONEN, JERRY ; MAKINEN JONI</creatorcontrib><description>The present invention relates to a sampling system (100) in which sampling is based on removal of material from a sample immersed in a fluid by cavitation caused by high intensity focused ultrasound (HIFU). The system further comprises a feeding device (105) for conveying at least a portion of the material removed from the fluid to the detection device (106). The invention also relates to a method of feeding material from a sample to a detection device using the sampling system.
本发明涉及一种取样系统(100)，其中，取样基于通过由高强度聚焦超声(HIFU)引起的空化从沉浸在流体中的样本中移除材料。该系统还包括用于将从流体移除的材料的至少一部分输送到检测装置(106)的馈送装置(105)。本发明还涉及使用取样系统将材料从样本馈送到检测装置的方法。</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240305&DB=EPODOC&CC=CN&NR=117652011A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240305&DB=EPODOC&CC=CN&NR=117652011A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SALMI, ARI</creatorcontrib><creatorcontrib>KOTIO TAPIO</creatorcontrib><creatorcontrib>LASSILA PETRI</creatorcontrib><creatorcontrib>HAEGGSTROM EDWARD</creatorcontrib><creatorcontrib>KULONEN ANTTI</creatorcontrib><creatorcontrib>HOLMSTRU M, ASSI</creatorcontrib><creatorcontrib>SILLANPUU, TOM</creatorcontrib><creatorcontrib>HYVONEN, JERRY</creatorcontrib><creatorcontrib>MAKINEN JONI</creatorcontrib><title>System and method for sampling</title><description>The present invention relates to a sampling system (100) in which sampling is based on removal of material from a sample immersed in a fluid by cavitation caused by high intensity focused ultrasound (HIFU). The system further comprises a feeding device (105) for conveying at least a portion of the material removed from the fluid to the detection device (106). The invention also relates to a method of feeding material from a sample to a detection device using the sampling system.
本发明涉及一种取样系统(100)，其中，取样基于通过由高强度聚焦超声(HIFU)引起的空化从沉浸在流体中的样本中移除材料。该系统还包括用于将从流体移除的材料的至少一部分输送到检测装置(106)的馈送装置(105)。本发明还涉及使用取样系统将材料从样本馈送到检测装置的方法。</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJALriwuSc1VSMxLUchNLcnIT1FIyy9SKE7MLcjJzEvnYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhuZmpkYGhoaOxsSoAQDqRSRQ</recordid><startdate>20240305</startdate><enddate>20240305</enddate><creator>SALMI, ARI</creator><creator>KOTIO TAPIO</creator><creator>LASSILA PETRI</creator><creator>HAEGGSTROM EDWARD</creator><creator>KULONEN ANTTI</creator><creator>HOLMSTRU M, ASSI</creator><creator>SILLANPUU, TOM</creator><creator>HYVONEN, JERRY</creator><creator>MAKINEN JONI</creator><scope>EVB</scope></search><sort><creationdate>20240305</creationdate><title>System and method for sampling</title><author>SALMI, ARI ; KOTIO TAPIO ; LASSILA PETRI ; HAEGGSTROM EDWARD ; KULONEN ANTTI ; HOLMSTRU M, ASSI ; SILLANPUU, TOM ; HYVONEN, JERRY ; MAKINEN JONI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN117652011A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>SALMI, ARI</creatorcontrib><creatorcontrib>KOTIO TAPIO</creatorcontrib><creatorcontrib>LASSILA PETRI</creatorcontrib><creatorcontrib>HAEGGSTROM EDWARD</creatorcontrib><creatorcontrib>KULONEN ANTTI</creatorcontrib><creatorcontrib>HOLMSTRU M, ASSI</creatorcontrib><creatorcontrib>SILLANPUU, TOM</creatorcontrib><creatorcontrib>HYVONEN, JERRY</creatorcontrib><creatorcontrib>MAKINEN JONI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SALMI, ARI</au><au>KOTIO TAPIO</au><au>LASSILA PETRI</au><au>HAEGGSTROM EDWARD</au><au>KULONEN ANTTI</au><au>HOLMSTRU M, ASSI</au><au>SILLANPUU, TOM</au><au>HYVONEN, JERRY</au><au>MAKINEN JONI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>System and method for sampling</title><date>2024-03-05</date><risdate>2024</risdate><abstract>The present invention relates to a sampling system (100) in which sampling is based on removal of material from a sample immersed in a fluid by cavitation caused by high intensity focused ultrasound (HIFU). The system further comprises a feeding device (105) for conveying at least a portion of the material removed from the fluid to the detection device (106). The invention also relates to a method of feeding material from a sample to a detection device using the sampling system.
本发明涉及一种取样系统(100)，其中，取样基于通过由高强度聚焦超声(HIFU)引起的空化从沉浸在流体中的样本中移除材料。该系统还包括用于将从流体移除的材料的至少一部分输送到检测装置(106)的馈送装置(105)。本发明还涉及使用取样系统将材料从样本馈送到检测装置的方法。</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY |
| title | System and method for sampling |
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