Microscope rotation early warning system based on side observation

The invention discloses a microscope rotation early warning system based on side observation, and the system comprises an initial morphology obtaining module, a to-be-measured object position prediction module, a to-be-measured object movement position prediction module, a main lens rotation positio...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MENG CHAO, LI HENG, CUI YUANCHI, WEI XIN, LI CHENGWU, HAN SHUO
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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