Special control system for thickness measurement scanning device

The invention provides a special control system for a thickness measurement scanning device, which comprises a logic control module, a driving control module, a power supply module, an encoder input module, a sensor interface, a communication interface, a panel switch signal interface, a limit switc...

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Hauptverfasser: YANG MU, CAO JINGZHONG, YANG HUIHUA
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creator YANG MU
CAO JINGZHONG
YANG HUIHUA
description The invention provides a special control system for a thickness measurement scanning device, which comprises a logic control module, a driving control module, a power supply module, an encoder input module, a sensor interface, a communication interface, a panel switch signal interface, a limit switch signal interface, an alarm output module and a power supply output module, the logic control module is respectively connected with the driving control module, the power supply module, the encoder input module, the sensor interface, the communication interface, the panel switch signal interface, the limit switch signal interface, the alarm output module and the power supply output module, and the logic control module is connected and communicated with an upper computer through the communication interface. The control logic, the IO interface, the AD module, the power management module, the driving module and the communication interface are integrated. 本发明提供了一种测厚扫描装置专用控制系统,包括:逻辑控制模块、驱动控制模块、电源模块、编码器输入模块、传感器接口、通讯接口、面板
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subjects CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
TESTING
title Special control system for thickness measurement scanning device
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