Buried point test method, device and equipment and storage medium

The invention provides a burying point testing method, device and equipment and a storage medium. The buried point testing method comprises the following steps: querying a first quantity of captured buried point data according to buried point parameters of a to-be-tested buried point; in response to...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	XU HANJIAN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
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