Method for comprehensively measuring time-frequency parameters of any frequency point in wide range

Method for comprehensively measuring time-frequency parameters of any frequency point in wide range

The invention discloses a method for comprehensively measuring time-frequency parameters of any frequency point in a wide range, which relates to the technical field of signal processing, and comprises the following steps: respectively sampling a reference signal A and a measured signal B through a...

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Hauptverfasser: SHI RUIQIAN, ZHENG KAIFANG, JIA RUIJUAN, SHI JUBIN
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator SHI RUIQIAN
ZHENG KAIFANG
JIA RUIJUAN
SHI JUBIN
description The invention discloses a method for comprehensively measuring time-frequency parameters of any frequency point in a wide range, which relates to the technical field of signal processing, and comprises the following steps: respectively sampling a reference signal A and a measured signal B through a time-interleaved ADC (Analog to Digital Converter), respectively converting the reference signal A and the measured signal B into digital signals, and after the sampling of the reference signal A and the measured signal B is completed, outputting the digital signals; and performing signal noise reduction processing on the reference signal A and the measured signal B respectively. The invention provides a time-frequency parameter comprehensive measurement method for any frequency point in a wide range, which ensures that time-frequency characteristics and B code errors can be easily measured under the condition that only one device is used, including digital phase measurement based on AD sampling, high-precision pul
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Method for comprehensively measuring time-frequency parameters of any frequency point in wide range
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