Food temperature probe
The invention relates to a food temperature probe which comprises a probe body, and the probe body is provided with a measuring head used for being inserted into food. The food probe is arranged in the probe main body and is arranged at the position of the measuring head; the control circuit board i...
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| creator | HE JINKUN ZENG ZHAOTING |
| description | The invention relates to a food temperature probe which comprises a probe body, and the probe body is provided with a measuring head used for being inserted into food. The food probe is arranged in the probe main body and is arranged at the position of the measuring head; the control circuit board is arranged in the probe main body and is electrically connected with the food probe; the ceramic handle is assembled with one end, far away from the measuring head, of the probe main body; and the furnace temperature probe is arranged in the ceramic handle and is electrically connected with the control circuit board. A cook can conveniently know two numerical values of the food temperature and the temperature in the oven at the same time, so that the temperature deviation between the set value of the temperature in the oven and the actual detection value can be eliminated, the cook can accurately control the baking maturity of the food under the condition of comprehensively considering accurate parameters such as t |
| format | Patent |
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The food probe is arranged in the probe main body and is arranged at the position of the measuring head; the control circuit board is arranged in the probe main body and is electrically connected with the food probe; the ceramic handle is assembled with one end, far away from the measuring head, of the probe main body; and the furnace temperature probe is arranged in the ceramic handle and is electrically connected with the control circuit board. A cook can conveniently know two numerical values of the food temperature and the temperature in the oven at the same time, so that the temperature deviation between the set value of the temperature in the oven and the actual detection value can be eliminated, the cook can accurately control the baking maturity of the food under the condition of comprehensively considering accurate parameters such as t</description><language>chi ; eng</language><subject>MEASURING ; MEASURING QUANTITY OF HEAT ; MEASURING TEMPERATURE ; PHYSICS ; TESTING ; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240112&DB=EPODOC&CC=CN&NR=117387795A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240112&DB=EPODOC&CC=CN&NR=117387795A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HE JINKUN</creatorcontrib><creatorcontrib>ZENG ZHAOTING</creatorcontrib><title>Food temperature probe</title><description>The invention relates to a food temperature probe which comprises a probe body, and the probe body is provided with a measuring head used for being inserted into food. The food probe is arranged in the probe main body and is arranged at the position of the measuring head; the control circuit board is arranged in the probe main body and is electrically connected with the food probe; the ceramic handle is assembled with one end, far away from the measuring head, of the probe main body; and the furnace temperature probe is arranged in the ceramic handle and is electrically connected with the control circuit board. A cook can conveniently know two numerical values of the food temperature and the temperature in the oven at the same time, so that the temperature deviation between the set value of the temperature in the oven and the actual detection value can be eliminated, the cook can accurately control the baking maturity of the food under the condition of comprehensively considering accurate parameters such as t</description><subject>MEASURING</subject><subject>MEASURING QUANTITY OF HEAT</subject><subject>MEASURING TEMPERATURE</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBBzy89PUShJzS1ILUosKS1KVSgoyk9K5WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hobmxhbm5pamjsbEqAEApbMhqw</recordid><startdate>20240112</startdate><enddate>20240112</enddate><creator>HE JINKUN</creator><creator>ZENG ZHAOTING</creator><scope>EVB</scope></search><sort><creationdate>20240112</creationdate><title>Food temperature probe</title><author>HE JINKUN ; ZENG ZHAOTING</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN117387795A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING QUANTITY OF HEAT</topic><topic>MEASURING TEMPERATURE</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>HE JINKUN</creatorcontrib><creatorcontrib>ZENG ZHAOTING</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HE JINKUN</au><au>ZENG ZHAOTING</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Food temperature probe</title><date>2024-01-12</date><risdate>2024</risdate><abstract>The invention relates to a food temperature probe which comprises a probe body, and the probe body is provided with a measuring head used for being inserted into food. The food probe is arranged in the probe main body and is arranged at the position of the measuring head; the control circuit board is arranged in the probe main body and is electrically connected with the food probe; the ceramic handle is assembled with one end, far away from the measuring head, of the probe main body; and the furnace temperature probe is arranged in the ceramic handle and is electrically connected with the control circuit board. A cook can conveniently know two numerical values of the food temperature and the temperature in the oven at the same time, so that the temperature deviation between the set value of the temperature in the oven and the actual detection value can be eliminated, the cook can accurately control the baking maturity of the food under the condition of comprehensively considering accurate parameters such as t</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN117387795A |
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| subjects | MEASURING MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR |
| title | Food temperature probe |
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