Electronic load testing device
The invention aims to provide the electronic load testing device which is low in cost, small in size, wide in application range and high in integration level. The circuit comprises an electronic load, a current adjusting module, a voltage measuring module, a current sampling module, an ADC module, a...
Gespeichert in:
| Hauptverfasser: | , , , , , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | HUANG ZHIQIANG ZHANG YANFANG WANG HAILAI SUN SHENGZHEN PAN ZHAOHONG KANG MINGYONG SU JIN WANG QING ZHAO FUJIE SONG GUOYONG FENG ZHANGFA |
| description | The invention aims to provide the electronic load testing device which is low in cost, small in size, wide in application range and high in integration level. The circuit comprises an electronic load, a current adjusting module, a voltage measuring module, a current sampling module, an ADC module, a DAC module and a main control module, the output end of the current adjusting module and the input end of the voltage measuring module are both connected with the electronic load, and the current adjusting module is grounded through the current sampling module. The current sampling module is connected to the main control module through the ADC module, the input end of the current adjusting module is connected to the main control module through the DAC module, the output end of the voltage measuring module is connected to the main control module, and the main control module is connected with an external upper computer. The method is applied to the technical field of electronic product PCBA mainboard testing.
本发明旨在提 |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN117310438A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN117310438A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN117310438A3</originalsourceid><addsrcrecordid>eNrjZJBzzUlNLinKz8tMVsjJT0xRKEktLsnMS1dISS3LTE7lYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhubGhgYmxhaOxsSoAQD3MyRz</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Electronic load testing device</title><source>esp@cenet</source><creator>HUANG ZHIQIANG ; ZHANG YANFANG ; WANG HAILAI ; SUN SHENGZHEN ; PAN ZHAOHONG ; KANG MINGYONG ; SU JIN ; WANG QING ; ZHAO FUJIE ; SONG GUOYONG ; FENG ZHANGFA</creator><creatorcontrib>HUANG ZHIQIANG ; ZHANG YANFANG ; WANG HAILAI ; SUN SHENGZHEN ; PAN ZHAOHONG ; KANG MINGYONG ; SU JIN ; WANG QING ; ZHAO FUJIE ; SONG GUOYONG ; FENG ZHANGFA</creatorcontrib><description>The invention aims to provide the electronic load testing device which is low in cost, small in size, wide in application range and high in integration level. The circuit comprises an electronic load, a current adjusting module, a voltage measuring module, a current sampling module, an ADC module, a DAC module and a main control module, the output end of the current adjusting module and the input end of the voltage measuring module are both connected with the electronic load, and the current adjusting module is grounded through the current sampling module. The current sampling module is connected to the main control module through the ADC module, the input end of the current adjusting module is connected to the main control module through the DAC module, the output end of the voltage measuring module is connected to the main control module, and the main control module is connected with an external upper computer. The method is applied to the technical field of electronic product PCBA mainboard testing.
本发明旨在提</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231229&DB=EPODOC&CC=CN&NR=117310438A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231229&DB=EPODOC&CC=CN&NR=117310438A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HUANG ZHIQIANG</creatorcontrib><creatorcontrib>ZHANG YANFANG</creatorcontrib><creatorcontrib>WANG HAILAI</creatorcontrib><creatorcontrib>SUN SHENGZHEN</creatorcontrib><creatorcontrib>PAN ZHAOHONG</creatorcontrib><creatorcontrib>KANG MINGYONG</creatorcontrib><creatorcontrib>SU JIN</creatorcontrib><creatorcontrib>WANG QING</creatorcontrib><creatorcontrib>ZHAO FUJIE</creatorcontrib><creatorcontrib>SONG GUOYONG</creatorcontrib><creatorcontrib>FENG ZHANGFA</creatorcontrib><title>Electronic load testing device</title><description>The invention aims to provide the electronic load testing device which is low in cost, small in size, wide in application range and high in integration level. The circuit comprises an electronic load, a current adjusting module, a voltage measuring module, a current sampling module, an ADC module, a DAC module and a main control module, the output end of the current adjusting module and the input end of the voltage measuring module are both connected with the electronic load, and the current adjusting module is grounded through the current sampling module. The current sampling module is connected to the main control module through the ADC module, the input end of the current adjusting module is connected to the main control module through the DAC module, the output end of the voltage measuring module is connected to the main control module, and the main control module is connected with an external upper computer. The method is applied to the technical field of electronic product PCBA mainboard testing.
本发明旨在提</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJBzzUlNLinKz8tMVsjJT0xRKEktLsnMS1dISS3LTE7lYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhubGhgYmxhaOxsSoAQD3MyRz</recordid><startdate>20231229</startdate><enddate>20231229</enddate><creator>HUANG ZHIQIANG</creator><creator>ZHANG YANFANG</creator><creator>WANG HAILAI</creator><creator>SUN SHENGZHEN</creator><creator>PAN ZHAOHONG</creator><creator>KANG MINGYONG</creator><creator>SU JIN</creator><creator>WANG QING</creator><creator>ZHAO FUJIE</creator><creator>SONG GUOYONG</creator><creator>FENG ZHANGFA</creator><scope>EVB</scope></search><sort><creationdate>20231229</creationdate><title>Electronic load testing device</title><author>HUANG ZHIQIANG ; ZHANG YANFANG ; WANG HAILAI ; SUN SHENGZHEN ; PAN ZHAOHONG ; KANG MINGYONG ; SU JIN ; WANG QING ; ZHAO FUJIE ; SONG GUOYONG ; FENG ZHANGFA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN117310438A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HUANG ZHIQIANG</creatorcontrib><creatorcontrib>ZHANG YANFANG</creatorcontrib><creatorcontrib>WANG HAILAI</creatorcontrib><creatorcontrib>SUN SHENGZHEN</creatorcontrib><creatorcontrib>PAN ZHAOHONG</creatorcontrib><creatorcontrib>KANG MINGYONG</creatorcontrib><creatorcontrib>SU JIN</creatorcontrib><creatorcontrib>WANG QING</creatorcontrib><creatorcontrib>ZHAO FUJIE</creatorcontrib><creatorcontrib>SONG GUOYONG</creatorcontrib><creatorcontrib>FENG ZHANGFA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HUANG ZHIQIANG</au><au>ZHANG YANFANG</au><au>WANG HAILAI</au><au>SUN SHENGZHEN</au><au>PAN ZHAOHONG</au><au>KANG MINGYONG</au><au>SU JIN</au><au>WANG QING</au><au>ZHAO FUJIE</au><au>SONG GUOYONG</au><au>FENG ZHANGFA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Electronic load testing device</title><date>2023-12-29</date><risdate>2023</risdate><abstract>The invention aims to provide the electronic load testing device which is low in cost, small in size, wide in application range and high in integration level. The circuit comprises an electronic load, a current adjusting module, a voltage measuring module, a current sampling module, an ADC module, a DAC module and a main control module, the output end of the current adjusting module and the input end of the voltage measuring module are both connected with the electronic load, and the current adjusting module is grounded through the current sampling module. The current sampling module is connected to the main control module through the ADC module, the input end of the current adjusting module is connected to the main control module through the DAC module, the output end of the voltage measuring module is connected to the main control module, and the main control module is connected with an external upper computer. The method is applied to the technical field of electronic product PCBA mainboard testing.
本发明旨在提</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN117310438A |
| source | esp@cenet |
| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Electronic load testing device |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T22%3A46%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HUANG%20ZHIQIANG&rft.date=2023-12-29&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN117310438A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |