Secondary instrument calibration method
The invention discloses a secondary instrument calibration method, which relates to the technical field of secondary instrument calibration and comprises the following steps of: initializing and self-checking a system; automatic multi-point calibration is carried out; real-time feedback and self-ada...
Gespeichert in:
| Hauptverfasser: | , , , , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | WANG YING LI CHEN XU JIAN ZHANG YULYU ZHAO XIA SHI QUFEI WU JIAN SUN CHEN WANG YUANYUAN PEI MINGZAN |
| description | The invention discloses a secondary instrument calibration method, which relates to the technical field of secondary instrument calibration and comprises the following steps of: initializing and self-checking a system; automatic multi-point calibration is carried out; real-time feedback and self-adaptive calibration are carried out; environmental factors are monitored in real time, data are recorded, and calibration parameters are automatically adjusted according to changes of the environmental factors; automatically analyzing all calibration data by the system, and automatically optimizing a calibration algorithm and parameters by the system based on a data analysis result; the system automatically generates a calibration report including calibration parameters, calibration results and environmental factor data. According to the method, various technologies and methods are comprehensively applied, an efficient, accurate and reliable conductivity meter calibration system is realized, and strict calibration re |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN117235511A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN117235511A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN117235511A3</originalsourceid><addsrcrecordid>eNrjZFAPTk3Oz0tJLKpUyMwrLikqzU3NK1FITszJTCpKLMnMz1PITS3JyE_hYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhuZGxqamhoaOxsSoAQDbayhs</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Secondary instrument calibration method</title><source>esp@cenet</source><creator>WANG YING ; LI CHEN ; XU JIAN ; ZHANG YULYU ; ZHAO XIA ; SHI QUFEI ; WU JIAN ; SUN CHEN ; WANG YUANYUAN ; PEI MINGZAN</creator><creatorcontrib>WANG YING ; LI CHEN ; XU JIAN ; ZHANG YULYU ; ZHAO XIA ; SHI QUFEI ; WU JIAN ; SUN CHEN ; WANG YUANYUAN ; PEI MINGZAN</creatorcontrib><description>The invention discloses a secondary instrument calibration method, which relates to the technical field of secondary instrument calibration and comprises the following steps of: initializing and self-checking a system; automatic multi-point calibration is carried out; real-time feedback and self-adaptive calibration are carried out; environmental factors are monitored in real time, data are recorded, and calibration parameters are automatically adjusted according to changes of the environmental factors; automatically analyzing all calibration data by the system, and automatically optimizing a calibration algorithm and parameters by the system based on a data analysis result; the system automatically generates a calibration report including calibration parameters, calibration results and environmental factor data. According to the method, various technologies and methods are comprehensively applied, an efficient, accurate and reliable conductivity meter calibration system is realized, and strict calibration re</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231215&DB=EPODOC&CC=CN&NR=117235511A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231215&DB=EPODOC&CC=CN&NR=117235511A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WANG YING</creatorcontrib><creatorcontrib>LI CHEN</creatorcontrib><creatorcontrib>XU JIAN</creatorcontrib><creatorcontrib>ZHANG YULYU</creatorcontrib><creatorcontrib>ZHAO XIA</creatorcontrib><creatorcontrib>SHI QUFEI</creatorcontrib><creatorcontrib>WU JIAN</creatorcontrib><creatorcontrib>SUN CHEN</creatorcontrib><creatorcontrib>WANG YUANYUAN</creatorcontrib><creatorcontrib>PEI MINGZAN</creatorcontrib><title>Secondary instrument calibration method</title><description>The invention discloses a secondary instrument calibration method, which relates to the technical field of secondary instrument calibration and comprises the following steps of: initializing and self-checking a system; automatic multi-point calibration is carried out; real-time feedback and self-adaptive calibration are carried out; environmental factors are monitored in real time, data are recorded, and calibration parameters are automatically adjusted according to changes of the environmental factors; automatically analyzing all calibration data by the system, and automatically optimizing a calibration algorithm and parameters by the system based on a data analysis result; the system automatically generates a calibration report including calibration parameters, calibration results and environmental factor data. According to the method, various technologies and methods are comprehensively applied, an efficient, accurate and reliable conductivity meter calibration system is realized, and strict calibration re</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAPTk3Oz0tJLKpUyMwrLikqzU3NK1FITszJTCpKLMnMz1PITS3JyE_hYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhuZGxqamhoaOxsSoAQDbayhs</recordid><startdate>20231215</startdate><enddate>20231215</enddate><creator>WANG YING</creator><creator>LI CHEN</creator><creator>XU JIAN</creator><creator>ZHANG YULYU</creator><creator>ZHAO XIA</creator><creator>SHI QUFEI</creator><creator>WU JIAN</creator><creator>SUN CHEN</creator><creator>WANG YUANYUAN</creator><creator>PEI MINGZAN</creator><scope>EVB</scope></search><sort><creationdate>20231215</creationdate><title>Secondary instrument calibration method</title><author>WANG YING ; LI CHEN ; XU JIAN ; ZHANG YULYU ; ZHAO XIA ; SHI QUFEI ; WU JIAN ; SUN CHEN ; WANG YUANYUAN ; PEI MINGZAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN117235511A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WANG YING</creatorcontrib><creatorcontrib>LI CHEN</creatorcontrib><creatorcontrib>XU JIAN</creatorcontrib><creatorcontrib>ZHANG YULYU</creatorcontrib><creatorcontrib>ZHAO XIA</creatorcontrib><creatorcontrib>SHI QUFEI</creatorcontrib><creatorcontrib>WU JIAN</creatorcontrib><creatorcontrib>SUN CHEN</creatorcontrib><creatorcontrib>WANG YUANYUAN</creatorcontrib><creatorcontrib>PEI MINGZAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WANG YING</au><au>LI CHEN</au><au>XU JIAN</au><au>ZHANG YULYU</au><au>ZHAO XIA</au><au>SHI QUFEI</au><au>WU JIAN</au><au>SUN CHEN</au><au>WANG YUANYUAN</au><au>PEI MINGZAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Secondary instrument calibration method</title><date>2023-12-15</date><risdate>2023</risdate><abstract>The invention discloses a secondary instrument calibration method, which relates to the technical field of secondary instrument calibration and comprises the following steps of: initializing and self-checking a system; automatic multi-point calibration is carried out; real-time feedback and self-adaptive calibration are carried out; environmental factors are monitored in real time, data are recorded, and calibration parameters are automatically adjusted according to changes of the environmental factors; automatically analyzing all calibration data by the system, and automatically optimizing a calibration algorithm and parameters by the system based on a data analysis result; the system automatically generates a calibration report including calibration parameters, calibration results and environmental factor data. According to the method, various technologies and methods are comprehensively applied, an efficient, accurate and reliable conductivity meter calibration system is realized, and strict calibration re</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN117235511A |
| source | esp@cenet |
| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Secondary instrument calibration method |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-20T17%3A33%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WANG%20YING&rft.date=2023-12-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN117235511A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |