Inspection system, inspection device, inspection method, and inspection program

An examination system (1000) is provided with an imaging device (16), a processor (21) for examining the wettability of an eye on the basis of a captured image obtained by imaging the eye by the imaging device (16) and an estimation model (232) including a neural network (2321), and a display (15) f...

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Bibliographische Detailangaben
Hauptverfasser: SHIRAISHI KAZUO, TAKE DAIJIRO, KISHIMOTO MAYUMI, OSHITA YOSHIHIRO
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:An examination system (1000) is provided with an imaging device (16), a processor (21) for examining the wettability of an eye on the basis of a captured image obtained by imaging the eye by the imaging device (16) and an estimation model (232) including a neural network (2321), and a display (15) for displaying the examination result of the processor (21). 检查系统(1000)具备摄像装置(16)、基于通过摄像装置(16)拍摄眼而得到的拍摄图像和包含神经网络(2321)的推定模型(232)检查眼的湿润度的处理器(21)、以及显示处理器(21)的检查结果的显示器(15)。