Cross-scale defect detection method

Cross-scale defect detection method

The invention relates to a cross-scale defect detection method which comprises the following steps: S1, acquiring surface defect data of an object to be detected, and classifying and defining defects; s2, performing feature extraction on defect-containing data in the original image to obtain cross-s...

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Hauptverfasser: SHAN ZHONGDE, WANG JUN, PU CHENGHAN, GAO CHANGCAI
Format: Patent
Sprache:chi ; eng
Schlagworte:
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
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creator SHAN ZHONGDE
WANG JUN
PU CHENGHAN
GAO CHANGCAI
description The invention relates to a cross-scale defect detection method which comprises the following steps: S1, acquiring surface defect data of an object to be detected, and classifying and defining defects; s2, performing feature extraction on defect-containing data in the original image to obtain cross-scale defect edge features; s3, inputting the original image data and the cross-scale defect edge features of the object to be detected into the SwinIDE-merge network model, and extracting high-dimensional defect information; s4, constructing a defect detection model, outputting the high-dimensional defect information to the defect detection model, and detecting a bounding box prediction result and a classification result of the defects; and S5, aiming at the defect detection model of the cross-scale defect, adopting a Wasserstein distance as a loss function, carrying out training and weight updating on the model, and obtaining a final defect detection model. According to the feature extraction method, fewer down-sa
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subjects CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
title Cross-scale defect detection method
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