Method for measuring surface tension by observing bending deformation of micron beam

The invention discloses a method for measuring surface tension by observing bending deformation of a micron beam, and belongs to the field of measuring methods. The device is mainly composed of a micron beam and a micro force generator which are fixed in a test box, the micro force generator firstly...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HE JIN, CUI YIQIONG, MAO DONG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!