Signature quality inspection method and device
The invention relates to the technical field of artificial intelligence, in particular to a signature quality inspection method and device. The signature quality inspection method comprises the following steps: correcting a first image by adopting an affine transformation matrix to obtain a second i...
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| creator | WU BAOTING LI HONG LIU SHAOWU KONG YI LIU FUSHENG YU YITING WU WEI ZHANG HONGHONG CHEN ZHUO LIN GANG ZHU JIAN FANG SHAOYIN CUI ZHISHUN NI CHUNYA CHEN HANXIANG XU YAOSHUN PANG BIN DANG ZHIJUN WAN QI ZUO JIAN ZHANG HAOJIE LI ZIMENG YU XIANGCHEN JI YI KANG YUE CAI JINGYI CAI TIEGUANG WANG SONG SUN JIANJUN ZHENG HAOBIN |
| description | The invention relates to the technical field of artificial intelligence, in particular to a signature quality inspection method and device. The signature quality inspection method comprises the following steps: correcting a first image by adopting an affine transformation matrix to obtain a second image; comparing a template image corresponding to the form type of the first image with the second image to obtain a first signature area and a second signature area in the second image; and carrying out quality inspection on the first signature region and the second signature region by adopting structural similarity SSIN, and determining the authenticity of the signature corresponding to the first image. According to the invention, a signature quality inspection mechanism can be provided, and the accuracy of signature quality inspection is improved.
本公开涉及人工智能技术领域，尤其涉及一种签名质检方法、装置。其中，该签名质检方法，包括：采用仿射变换矩阵对第一图像进行矫正，得到第二图像；对所述第一图像的表单类型对应的模板图像和所述第二图像进行对比，获取所述第二图像中的第一签名区域和第二签名区域；采用结构相似性SSIN对所述第一签名区域和所述第二签名区域进行质检，确定所述第一图像对 |
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本公开涉及人工智能技术领域，尤其涉及一种签名质检方法、装置。其中，该签名质检方法，包括：采用仿射变换矩阵对第一图像进行矫正，得到第二图像；对所述第一图像的表单类型对应的模板图像和所述第二图像进行对比，获取所述第二图像中的第一签名区域和第二签名区域；采用结构相似性SSIN对所述第一签名区域和所述第二签名区域进行质检，确定所述第一图像对</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; PHYSICS</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231114&DB=EPODOC&CC=CN&NR=117058768A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231114&DB=EPODOC&CC=CN&NR=117058768A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WU BAOTING</creatorcontrib><creatorcontrib>LI HONG</creatorcontrib><creatorcontrib>LIU SHAOWU</creatorcontrib><creatorcontrib>KONG YI</creatorcontrib><creatorcontrib>LIU FUSHENG</creatorcontrib><creatorcontrib>YU YITING</creatorcontrib><creatorcontrib>WU WEI</creatorcontrib><creatorcontrib>ZHANG HONGHONG</creatorcontrib><creatorcontrib>CHEN ZHUO</creatorcontrib><creatorcontrib>LIN GANG</creatorcontrib><creatorcontrib>ZHU JIAN</creatorcontrib><creatorcontrib>FANG SHAOYIN</creatorcontrib><creatorcontrib>CUI ZHISHUN</creatorcontrib><creatorcontrib>NI CHUNYA</creatorcontrib><creatorcontrib>CHEN HANXIANG</creatorcontrib><creatorcontrib>XU YAOSHUN</creatorcontrib><creatorcontrib>PANG BIN</creatorcontrib><creatorcontrib>DANG ZHIJUN</creatorcontrib><creatorcontrib>WAN QI</creatorcontrib><creatorcontrib>ZUO JIAN</creatorcontrib><creatorcontrib>ZHANG HAOJIE</creatorcontrib><creatorcontrib>LI ZIMENG</creatorcontrib><creatorcontrib>YU XIANGCHEN</creatorcontrib><creatorcontrib>JI YI</creatorcontrib><creatorcontrib>KANG YUE</creatorcontrib><creatorcontrib>CAI JINGYI</creatorcontrib><creatorcontrib>CAI TIEGUANG</creatorcontrib><creatorcontrib>WANG SONG</creatorcontrib><creatorcontrib>SUN JIANJUN</creatorcontrib><creatorcontrib>ZHENG HAOBIN</creatorcontrib><title>Signature quality inspection method and device</title><description>The invention relates to the technical field of artificial intelligence, in particular to a signature quality inspection method and device. The signature quality inspection method comprises the following steps: correcting a first image by adopting an affine transformation matrix to obtain a second image; comparing a template image corresponding to the form type of the first image with the second image to obtain a first signature area and a second signature area in the second image; and carrying out quality inspection on the first signature region and the second signature region by adopting structural similarity SSIN, and determining the authenticity of the signature corresponding to the first image. According to the invention, a signature quality inspection mechanism can be provided, and the accuracy of signature quality inspection is improved.
本公开涉及人工智能技术领域，尤其涉及一种签名质检方法、装置。其中，该签名质检方法，包括：采用仿射变换矩阵对第一图像进行矫正，得到第二图像；对所述第一图像的表单类型对应的模板图像和所述第二图像进行对比，获取所述第二图像中的第一签名区域和第二签名区域；采用结构相似性SSIN对所述第一签名区域和所述第二签名区域进行质检，确定所述第一图像对</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNALzkzPSywpLUpVKCxNzMksqVTIzCsuSE0uyczPU8hNLcnIT1FIzEtRSEkty0xO5WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hobmBqYW5mYWjsbEqAEAIfcq5g</recordid><startdate>20231114</startdate><enddate>20231114</enddate><creator>WU BAOTING</creator><creator>LI HONG</creator><creator>LIU SHAOWU</creator><creator>KONG YI</creator><creator>LIU FUSHENG</creator><creator>YU YITING</creator><creator>WU WEI</creator><creator>ZHANG HONGHONG</creator><creator>CHEN ZHUO</creator><creator>LIN GANG</creator><creator>ZHU JIAN</creator><creator>FANG SHAOYIN</creator><creator>CUI ZHISHUN</creator><creator>NI CHUNYA</creator><creator>CHEN HANXIANG</creator><creator>XU YAOSHUN</creator><creator>PANG BIN</creator><creator>DANG ZHIJUN</creator><creator>WAN QI</creator><creator>ZUO JIAN</creator><creator>ZHANG HAOJIE</creator><creator>LI ZIMENG</creator><creator>YU XIANGCHEN</creator><creator>JI YI</creator><creator>KANG YUE</creator><creator>CAI JINGYI</creator><creator>CAI TIEGUANG</creator><creator>WANG SONG</creator><creator>SUN JIANJUN</creator><creator>ZHENG HAOBIN</creator><scope>EVB</scope></search><sort><creationdate>20231114</creationdate><title>Signature quality inspection method and device</title><author>WU BAOTING ; LI HONG ; LIU SHAOWU ; KONG YI ; LIU FUSHENG ; YU YITING ; WU WEI ; ZHANG HONGHONG ; CHEN ZHUO ; LIN GANG ; ZHU JIAN ; FANG SHAOYIN ; CUI ZHISHUN ; NI CHUNYA ; CHEN HANXIANG ; XU YAOSHUN ; PANG BIN ; DANG ZHIJUN ; WAN QI ; ZUO JIAN ; ZHANG HAOJIE ; LI ZIMENG ; YU XIANGCHEN ; JI YI ; KANG YUE ; CAI JINGYI ; CAI TIEGUANG ; WANG SONG ; SUN JIANJUN ; ZHENG HAOBIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN117058768A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>WU BAOTING</creatorcontrib><creatorcontrib>LI HONG</creatorcontrib><creatorcontrib>LIU SHAOWU</creatorcontrib><creatorcontrib>KONG YI</creatorcontrib><creatorcontrib>LIU FUSHENG</creatorcontrib><creatorcontrib>YU YITING</creatorcontrib><creatorcontrib>WU WEI</creatorcontrib><creatorcontrib>ZHANG HONGHONG</creatorcontrib><creatorcontrib>CHEN ZHUO</creatorcontrib><creatorcontrib>LIN GANG</creatorcontrib><creatorcontrib>ZHU JIAN</creatorcontrib><creatorcontrib>FANG SHAOYIN</creatorcontrib><creatorcontrib>CUI ZHISHUN</creatorcontrib><creatorcontrib>NI CHUNYA</creatorcontrib><creatorcontrib>CHEN HANXIANG</creatorcontrib><creatorcontrib>XU YAOSHUN</creatorcontrib><creatorcontrib>PANG BIN</creatorcontrib><creatorcontrib>DANG ZHIJUN</creatorcontrib><creatorcontrib>WAN QI</creatorcontrib><creatorcontrib>ZUO JIAN</creatorcontrib><creatorcontrib>ZHANG HAOJIE</creatorcontrib><creatorcontrib>LI ZIMENG</creatorcontrib><creatorcontrib>YU XIANGCHEN</creatorcontrib><creatorcontrib>JI YI</creatorcontrib><creatorcontrib>KANG YUE</creatorcontrib><creatorcontrib>CAI JINGYI</creatorcontrib><creatorcontrib>CAI TIEGUANG</creatorcontrib><creatorcontrib>WANG SONG</creatorcontrib><creatorcontrib>SUN JIANJUN</creatorcontrib><creatorcontrib>ZHENG HAOBIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WU BAOTING</au><au>LI HONG</au><au>LIU SHAOWU</au><au>KONG YI</au><au>LIU FUSHENG</au><au>YU YITING</au><au>WU WEI</au><au>ZHANG HONGHONG</au><au>CHEN ZHUO</au><au>LIN GANG</au><au>ZHU JIAN</au><au>FANG SHAOYIN</au><au>CUI ZHISHUN</au><au>NI CHUNYA</au><au>CHEN HANXIANG</au><au>XU YAOSHUN</au><au>PANG BIN</au><au>DANG ZHIJUN</au><au>WAN QI</au><au>ZUO JIAN</au><au>ZHANG HAOJIE</au><au>LI ZIMENG</au><au>YU XIANGCHEN</au><au>JI YI</au><au>KANG YUE</au><au>CAI JINGYI</au><au>CAI TIEGUANG</au><au>WANG SONG</au><au>SUN JIANJUN</au><au>ZHENG HAOBIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Signature quality inspection method and device</title><date>2023-11-14</date><risdate>2023</risdate><abstract>The invention relates to the technical field of artificial intelligence, in particular to a signature quality inspection method and device. The signature quality inspection method comprises the following steps: correcting a first image by adopting an affine transformation matrix to obtain a second image; comparing a template image corresponding to the form type of the first image with the second image to obtain a first signature area and a second signature area in the second image; and carrying out quality inspection on the first signature region and the second signature region by adopting structural similarity SSIN, and determining the authenticity of the signature corresponding to the first image. According to the invention, a signature quality inspection mechanism can be provided, and the accuracy of signature quality inspection is improved.
本公开涉及人工智能技术领域，尤其涉及一种签名质检方法、装置。其中，该签名质检方法，包括：采用仿射变换矩阵对第一图像进行矫正，得到第二图像；对所述第一图像的表单类型对应的模板图像和所述第二图像进行对比，获取所述第二图像中的第一签名区域和第二签名区域；采用结构相似性SSIN对所述第一签名区域和所述第二签名区域进行质检，确定所述第一图像对</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING PHYSICS |
| title | Signature quality inspection method and device |
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